欢迎访问ic37.com |
会员登录 免费注册
发布采购

56F807_1 参数 Datasheet PDF下载

56F807_1图片预览
型号: 56F807_1
PDF下载: 下载PDF文件 查看货源
内容描述: 16位数字信号控制器 [16-bit Digital Signal Controllers]
分类和应用: 控制器
文件页数/大小: 60 页 / 649 K
品牌: FREESCALE [ Freescale ]
 浏览型号56F807_1的Datasheet PDF文件第16页浏览型号56F807_1的Datasheet PDF文件第17页浏览型号56F807_1的Datasheet PDF文件第18页浏览型号56F807_1的Datasheet PDF文件第19页浏览型号56F807_1的Datasheet PDF文件第21页浏览型号56F807_1的Datasheet PDF文件第22页浏览型号56F807_1的Datasheet PDF文件第23页浏览型号56F807_1的Datasheet PDF文件第24页  
2.14 JTAG/OnCE  
Table 2-19 JTAG/On-Chip Emulation (OnCE) Signals  
No. of  
Pins  
Signal  
Name  
Signal  
Type  
State During  
Reset  
Signal Description  
1
TCK  
Input  
(Schmitt)  
Input, pulled Test Clock Input—This input pin provides a gated clock to synchronize  
low internally the test logic and shift serial data to the JTAG/OnCE port. The pin is  
connected internally to a pull-down resistor.  
1
TMS  
Input  
(Schmitt)  
Input, pulled Test Mode Select Input—This input pin is used to sequence the JTAG  
high internally TAP controller’s state machine. It is sampled on the rising edge of TCK  
and has an on-chip pull-up resistor.  
Note: Always tie the TMS pin to VDD through a 2.2K resistor.  
1
1
1
TDI  
TDO  
TRST  
Input  
(Schmitt)  
Input, pulled Test Data Input—This input pin provides a serial input data stream to  
high internally the JTAG/OnCE port. It is sampled on the rising edge of TCK and has an  
on-chip pull-up resistor.  
Output  
Tri-stated  
Test Data Output—This tri-statable output pin provides a serial output  
data stream from the JTAG/OnCE port. It is driven in the Shift-IR and  
Shift-DR controller states, and changes on the falling edge of TCK.  
Input  
(Schmitt)  
Input, pulled Test Reset—As an input, a low signal on this pin provides a reset signal  
high internally to the JTAG TAP controller. To ensure complete hardware reset, TRST  
should be asserted at power-up and whenever RESET is asserted. The  
only exception occurs in a debugging environment when a hardware  
device reset is required and it is necessary not to reset the OnCE/JTAG  
module. In this case, assert RESET, but do not assert TRST.  
Note: For normal operation, connect TRST directly to VSS. If the design is to  
be used in a debugging environment, TRST may be tied to VSS through a 1K  
resistor.  
1
DE  
Output  
Output  
Debug Event—DE provides a low pulse on recognized debug events.  
Part 3 Specifications  
3.1 General Characteristics  
The 56F807 is fabricated in high-density CMOS with 5V-tolerant TTL-compatible digital inputs. The term  
“5V-tolerant” refers to the capability of an I/O pin, built on a 3.3V compatible process technology, to  
withstand a voltage up to 5.5V without damaging the device. Many systems have a mixture of devices  
designed for 3.3V and 5V power supplies. In such systems, a bus may carry both 3.3V and 5V-compatible  
I/O voltage levels (a standard 3.3V I/O is designed to receive a maximum voltage of 3.3V ± 10% during  
normal operation without causing damage). This 5V-tolerant capability therefore offers the power savings  
of 3.3V I/O levels while being able to receive 5V levels without being damaged.  
Absolute maximum ratings given in Table 3-1 are stress ratings only, and functional operation at the  
maximum is not guaranteed. Stress beyond these ratings may affect device reliability or cause permanent  
56F807 Technical Data Technical Data, Rev. 16  
20  
Freescale Semiconductor