MC33910G5AC/MC3433910G5AC
ELECTRICAL CHARACTERISTICS
DYNAMIC ELECTRICAL CHARACTERISTICS
Table 5. Dynamic Electrical Characteristics (continued)
Characteristics noted under conditions 5.5 V ≤ VSUP ≤ 18 V, -40°C ≤ TA ≤ 125°C for the 33910 and -40°C ≤ TA ≤ 85°C for the
34910, unless otherwise noted. Typical values noted reflect the approximate parameter mean at TA = 25°C under nominal
conditions, unless otherwise noted.
Characteristic
Symbol
Min
Typ
Max
Unit
V/μs
μs
LIN PHYSICAL LAYER: DRIVER CHARACTERISTICS FOR FAST SLEW RATE
LIN Fast Slew Rate (Programming Mode)
SR
—
20
—
FAST
LIN PHYSICAL LAYER: CHARACTERISTICS AND WAKE-UP TIMINGS(51)
Propagation Delay and Symmetry(52)
tREC_PD
Propagation Delay of Receiver, tREC_PD=MAX (tREC_PDR, tREC_PDF
Symmetry of Receiver Propagation Delay, tREC_PDF - tREC_PDR
)
—
4.2
—
6.0
2.0
tREC_SYM
-2.0
Bus Wake-Up Deglitcher (Sleep and Stop modes)(53)(57) (54)
tPROPWL
42
70
95
μs
μs
Bus Wake-Up Event Reported
From Sleep mode(55)
tWAKE_SLEEP
tWAKE_STOP
—
—
1500
35
From Stop mode(56)
9.0
27
TXD Permanent Dominant State Delay
tTXDDOM
0.65
1.0
1.35
s
PULSE WIDTH MODULATION INPUT PIN (PWMIN)
PWMIN pin(57)
fPWMIN
kHz
Max. frequency to drive HS output pins
10
Notes
51. VSUP from 7.0 to 18 V, bus load RBUS and CBUS 1.0 nF / 1.0 kΩ, 6.8 nF / 660 Ω, 10 nF / 500 Ω. Measurement thresholds: 50% of TXD
signal to LIN signal threshold defined at each parameter. See Figure 6.
52. See Figure 9
53. See Figure 10, for Sleep and Figure 11, for Stop mode.
54. This parameter is tested on automatic tester but has not been monitoring during operating life test.
55. The measurement is done with 1.0 µF capacitor and 0 mA current load on VDD. The value takes into account the delay to charge the
capacitor. The delay is measured between the bus wake-up threshold (VBUSWU) rising edge of the LIN bus and when V reaches 3.0 V.
DD
See Figure 10. The delay depends of the load and capacitor on VDD
.
56. In Stop mode, the delay is measured between the bus wake-up threshold (VBUSWU) and the falling edge of the IRQ pin. See Figure 11.
57. This parameter is guaranteed by process monitoring but not production tested.
33910
Analog Integrated Circuit Device Data
Freescale Semiconductor
19
FREESCALE [ Freescale ]
