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33742S 参数 Datasheet PDF下载

33742S图片预览
型号: 33742S
PDF下载: 下载PDF文件 查看货源
内容描述: 系统基础芯片( SBC)与增强型高速CAN收发器 [System Basis Chip (SBC) with Enhanced High-Speed CAN Transceiver]
分类和应用:
文件页数/大小: 65 页 / 1605 K
品牌: FREESCALE [ Freescale ]
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ELECTRICAL CHARACTERISTICS  
MAXIMUM RATINGS  
Table 4. Maximum Ratings (continued)  
All voltages are with respect to ground unless otherwise noted. Exceeding these ratings may cause a malfunction or  
permanent damage to the device.  
Rating  
Symbol  
Value  
Unit  
THERMAL RATINGS  
Operating Temperature  
Ambient  
°C  
TA  
TJ  
-40 to 125  
-40 to 150  
Junction  
Storage Temperature  
Thermal Resistance  
TSTG  
-55 to 165  
20  
°C  
RθJG  
RTJC-RθJC  
PD  
°C/W  
°C/W  
Thermal Resistance Junction Case (QFN)  
Power Dissipation (4)  
TBD  
1.0  
W
(7)  
Peak Package Reflow Temperature During Reflow (6)  
,
TPPRT  
Note 7  
°C  
Notes  
4. Maximum power dissipation is at 85°C ambient temperature in free aIr and with no heatsink, according to JEDEC JESD51-2 and  
JESD51-3 specifications.  
5. The package is not designed for immersion soldering. The maximum soldering time is 10 seconds at 240 °C on any pin. Exceeding the  
maximum temperature and time limits may cause permanent damage to the device.  
6. Pin soldering temperature limit is for 10 seconds maximum duration. Not designed for immersion soldering. Exceeding these limits may  
cause malfunction or permanent damage to the device.  
7. Freescale’s Package Reflow capability meets Pb-free requirements for JEDEC standard J-STD-020C. For Peak Package Reflow  
Temperature and Moisture Sensitivity Levels (MSL),  
Go to www.freescale.com, search by part number [e.g. remove prefixes/suffixes and enter the core ID to view all orderable parts. (i.e.  
MC33xxxD enter 33xxx), and review parametrics.  
33742  
CANH  
33742  
1.0 nF  
1.0 nF  
Transient Pulse  
Generator  
(Note)  
Transient Pulse  
Generator  
(Note)  
1.0 nF  
Lx  
CANL  
GND  
10 kΩ  
GND  
GND  
GND  
Note Waveform per ISO 7637-1. Test Pulses 1, 2, 3a, and 3b.  
Note Waveform per ISO 7637-1. Test Pulses 1, 2, 3a, and 3b.  
Figure 6. Transient Test Setup for CANH/CANL  
Figure 5. Transient Test Setup for L0:L3 Inputs  
33742  
Analog Integrated Circuit Device Data  
Freescale Semiconductor  
8
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