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33742S 参数 Datasheet PDF下载

33742S图片预览
型号: 33742S
PDF下载: 下载PDF文件 查看货源
内容描述: 系统基础芯片( SBC)与增强型高速CAN收发器 [System Basis Chip (SBC) with Enhanced High-Speed CAN Transceiver]
分类和应用:
文件页数/大小: 65 页 / 1605 K
品牌: FREESCALE [ Freescale ]
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ELECTRICAL CHARACTERISTICS  
MAXIMUM RATINGS  
ELECTRICAL CHARACTERISTICS  
MAXIMUM RATINGS  
Table 4. Maximum Ratings  
All voltages are with respect to ground unless otherwise noted. Exceeding these ratings may cause a malfunction or  
permanent damage to the device.  
Rating  
Symbol  
Value  
Unit  
ELECTRICAL RATINGS  
Power Supply Voltage at VSUP  
Continuous (Steady-State)  
VSUP  
V
-0.3 to 27  
-0.3 to 40  
Transient Voltage (Load Dump)  
Logic Signals  
VLOG  
-0.3 to VDD + 0.3  
V
(RXD, TXD, MOSI, MISO, CS, SCLK, RST, WDOG, and INT)  
Output Voltage at VDD  
Output Current at VDD  
VDD  
IDD  
0.0 to 5.3  
V
A
Internally Limited  
HS  
Voltage  
VHS  
IHS  
-0.3 to VSUP + 0.3  
Internally Limited  
V
A
Output Current  
ESD Capability, Human Body Model (1)  
HS, L0, L1, L2, L3, CANH, CANL pins  
All Other pins  
VESD1  
V
±4000  
±2000  
ESD Capability, Machine Model (1)  
VESD2  
±200  
V
Input Voltage/Current at L0, L1, L2, L3  
DC Input Voltage  
VDCIN  
IDCIN  
-0.3 to 40  
±2.0  
V
mA  
V
DC Input Current  
Transient Input Voltage attached to external circuitry (2)  
VTRINEC  
±100  
CANL and CANH  
Continuous Voltage  
Continuous Current  
VCANH/L  
ICANH/L  
-27 to 40  
200  
V
mA  
CANH and CANL Transient Voltage (Load Dump) (3)  
CANH and CANL Transient Voltage (3)  
Notes  
VLDH/L  
VTRH/L  
40  
V
V
±40  
1. Testing done in accordance with the Human Body Model (CZAP=100 pF, RZAP=1500 ), Machine Model (CZAP=200 pF, RZAP=0 ).  
2. Testing done in accordance with ISO 7637-1. See Figure 5.  
3. Load dump testing done in accordance with ISO 7637-1, Transient test done in accordance with ISO 7637-1. See Figure 6.  
33742  
Analog Integrated Circuit Device Data  
Freescale Semiconductor  
7
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