E S I
E S I
Excel Semiconductor inc.
DC CHARACTERISTICS
Table 7. CMOS Compatible
Parameter
Symbol
Parameter Description
Test Conditions
Min Typ
Max
Unit
ILI
Input Load Current
VIN=Vss to Vcc
Vcc=Vcc max
+ 1.0
uA
ILIT
ILR
ILO
A9 Input Load Current
Vcc=Vcc max; A9=12.5V
35
uA
uA
uA
RESET# Input Load Current
Output Leakage Current
Vcc=Vcc max; RESET#=12.5V
35
Vout=Vss to Vcc,
Vcc=Vcc max
+ 1.0
5MHz
7
2
15
4
CE#=VIL OE#=VIH, Byte
mode
1MHz
ICCI
Vcc Active Read Current
(Notes 1,2)
mA
CE#=VIL, OE#=VIH, Word
mode
5MHz
1MHz
7
15
4
2
ICC2
ICC3
ICC4
ICC5
Vcc Active Write Current (Note 2,3)
Vcc Standby Current (Note 2)
Vcc Reset Current (Note 2)
CE#=VIL, OE#=VIH, WE#=VIL
CE#, RESET#= Vcc+0.3V
RESET#=Vss + 0.3V
15
30
mA
uA
uA
uA
0.2
0.2
0.2
10
10
10
Automatic Sleep Mode
(Notes2,4)
VIH = Vcc + 0.3V
VIL = Vss + 0.3V
VIL
VIH
VID
Input Low Voltage
Input High Voltage
-0.5
0.5
V
V
V
0.7xVcc
11.5
Vcc+0.3
12.5
Voltage for Autoselect and
Temporary Sector Unprotect
Vcc = 3.0V + 10%
VOL
Output Low Voltage
IOL = 4.0 mA, Vcc = Vcc min
IOH = -2.0mA, Vcc = Vcc min
IOH = -100 uA, Vcc = Vcc min
0.45
V
VOH1
VOH2
VLKO
0.85 Vcc
Vcc - 0.4
2.3
Output High Voltage
V
V
Low Vcc Lock-Out Voltage (Note 5)
2.5
Notes:
1. The Icc current listed is typically less than 2 mA/MHz, with OE# at VIH , Typical condition : 25oC, Vcc = 3V
2. Maximum ICC specifications are tested with Vcc = Vcc max.
3. Icc active while Embedded Erase or Embedded Program is in progress.
4. Automatic sleep mode enables the low power mode when addresses remain stable for tACC + 30ns. Typical sleep mode current is
200 nA.
5. Not 100% tested.
27
Rev. 1D January 5, 2006
ES29LV800D