EtronTech
EM68C16CWQG
Table 22. AC overshoot/undershoot specification for clock, data, strobe, and mask pins
(DQ, UDQS, LDQS, UDQS#, LDQS#, DM, CK, CK#)
Parameter
-18I
0.5
-25I
0.5
-3I
0.5
Unit
V
Maximum peak amplitude allowed for overshoot area
Maximum peak amplitude allowed for undershoot area
Maximum overshoot area above VDD
0.5
0.5
0.5
V
0.19
0.19
0.23
0.23
0.23
0.23
V-ns
V-ns
Maximum undershoot area below VSS
Table 23. Output AC test conditions
Symbol
Parameter
Value
Unit Note
VOTR
Output timing measurement reference level
0.5 x VDDQ
V
1
NOTE1: The VDDQ of the device under test is referenced.
Table 24. Output DC current drive
Symbol
IOH(dc)
IOL(dc)
Parameter
SSTL_18
-13.4
Unit Note
1, 3, 4
2, 3, 4
Output minimum source DC current
Output minimum sink DC current
mA
mA
13.4
NOTE1: VDDQ = 1.7 V; VOUT = 1420 mV. (VOUT - VDDQ) /IOH must be less than 21 Ω for values of VOUT between VDDQ
and VDDQ - 280 mV.
NOTE2: VDDQ = 1.7 V; VOUT = 280 mV. VOUT/IOL must be less than 21 Ω for values of VOUT between 0 V and 280 mV.
NOTE3: The dc value of VREF applied to the receiving device is set to VTT
NOTE4: The values of IOH (dc) and IOL (dc) are based on the conditions given in Notes 1 and 2. They are used to test
device drive current capability to ensure VIH min plus a noise margin and VIL max minus a noise margin are
delivered to an SSTL_18 receiver. The actual current values are derived by shifting the desired driver
operating point (see JEDEC standard: Section 3.3 of JESD8-15A) along a 21 Ω load line to define a
convenient driver current for measurement.
Table 25. Capacitance
(VDD = 1.8V, TOPER = 25 C)
DDR2-1066/800
DDR2-667
Symbol
Parameter
Unit
Min.
1.0
1.0
2.5
-
Max.
1.75
2.0
Min.
Max.
2.0
Input Capacitance : Command and Address
Input Capacitance (CK, CK#)
CIN
CCK
1.0
1.0
2.5
-
pF
pF
pF
pF
pF
pF
2.0
DM, DQ, DQS Input/Output Capacitance
Delta Input Capacitance: Command and Address
Delta Input Capacitance: CK, CK#
CI/O
3.5
3.5
DCIN
DCCK
DCIO
0.25
0.25
0.5
0.25
0.25
0.5
-
-
Delta Input/Output Capacitance: DM, DQ, DQS
-
-
NOTE: These parameters are periodically sampled and are not 100% tested.
Rev. 1.2
24
Apr. /2016
ETRON [ ETRON TECHNOLOGY, INC. ]
