CAT1163
BLOCK DIAGRAM
RESET THRESHOLD OPTION
EXTERNAL LOAD
Part Dash
Number
Minimum
Threshold
Maximum
Threshold
SENSEAMPS
SHIFT REGISTERS
D
OUT
ACK
V
CC
-45
-42
-30
-28
-25
4.50
4.25
3.00
2.85
2.55
4.75
4.50
3.15
3.00
2.70
WORDADDRESS
BUFFERS
COLUMN
DECODERS
GND
START/STOP
LOGIC
SDA
EEPROM
XDEC
CONTROL
LOGIC
WP
DATA IN STORAGE
HIGHVOLTAGE/
TIMING CONTROL
RESET Controller
STATE COUNTERS
SCL
Precision
SLAVE
WATCHDOG
ADDRESS
COMPARATORS
Vcc Monitor
WDI RESET RESET
ABSOLUTE MAXIMUM RATINGS(1)
Parameters
Ratings
–55 to +125
–65 to +150
–2.0 to VCC + 2.0
–2.0 to 7.0
1.0
Units
ºC
ºC
V
Temperature Under Bias
Storage Temperature
Voltage on any Pin with Respect to Ground(2)
VCC with Respect to Ground
V
Package Power Dissipation Capability (TA = 25°C)
Lead Soldering Temperature (10 secs)
Output Short Circuit Current(3)
W
300
ºC
mA
100
REABILITY CHARACTERISTICS
Symbol
Parameter
Reference Test Method
Min
Max
Units
Cycles/Byte
Years
(4)
NEND
Endurance
MIL-STD-883, Test Method 1033
MIL-STD-883, Test Method 1008
MIL-STD-883, Test Method 3015
JEDEC Standard 17
1,000,000
100
(4)
TDR
Data Retention
ESD Susceptibility
Latch-up
(4)
VZAP
2000
Volts
(4)(5)
ILTH
100
mA
Notes:
(1) Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions outside of those listed in the operational sections of this
specification is not implied. Exposure to any absolute maximum rating for extended periods may affect device performance and reliability.
(2) The minimum DC input voltage is –0.5V. During transitions, inputs may undershoot to –2.0V for periods of less than 20ns. Maximum DC
voltage on output pins is VCC +0.5V, which may overshoot to VCC +2.0V for periods of less than 20 ns.
(3) Output shorted for no more than one second. No more than one output shorted at a time.
(4) This parameter is tested initially and after a design or process change that affects the parameter.
(5) Latch-up protection is provided for stresses up to 100mA on address and data pins from –1V to VCC +1V.
Doc. No. 3003 Rev. E
2
© 2007 Catalyst Semiconductor, Inc.
Characteristics subject to change without notice
CATALYST [ CATALYST SEMICONDUCTOR ]
