TMC22091/TMC22191
PRODUCT SPECIFICATION
Control Register Definitions (continued)
Test Control Register (03)
7
6
5
4
3
2
1
0
Reserved
LIMEN
TESTEN
HOLDEN
TSTMSB
LUMTST
8FSUBR
CHRTST
Reg
Bit
Name
Function
Reserved.
03
03
7
6
LIMEN
Luminance limiter enable. When LOW, all luminance values are passed to
modulator. when HIGH, luminance values are limited to 101 IRE.
03
03
03
03
03
5
4
3
2
1
TESTEN
Test enable. When LOW, normal operation is enabled. When HIGH,
TESTDAT
(Register 40) is connected to the composite output (READ) and
7-0
D/A converters (WRITE) for test.
HOLDEN
TSTMSB
LUMTST
8FSUBR
MSBs/LSBs hold select. When LOW, alternates MSBs and LSBs in test, at
PXCK rate. When HIGH, reads/writes only MSBS or LSBS in test (per
TSTMSB, bit 3)
LSBS,MSBS hold select. When LOW, connects 2 LSBs to TESTDAT
for testing when TESTEN is HIGH. When HIGH, connects 8 MSBs to
1-0
TESTDAT
for testing when TESTEN is HIGH.
7-0
LUMA channel test. When LOW (normal), the luminance D/A converter is
driven from luminance channel. When HIGH, the luminance D/A converter is
driven from TESTDAT for testing when TESTEN is HIGH.
8-field subcarrier reset enable. When LOW, the internal subcarrier generator is
reset with frequency and phase data from FREQ, SYSPH, and BURPH
registers every eight fields. When HIGH, the internal subcarrier generator free-
runs on the basis of frequency and phase data from the last time it was reset.
When RESET goes LOW, the subcarrier frequency and phase will be reset
from FREQ, SYSPH, and BURPH after field 8.
03
0
CHRTST
CHROMA channel test. When LOW (normal), the chrominance D/A converter is
driven from chrominance channel. When HIGH, the chrominance D/A converter
is driven from TESTDAT when TESTEN is HIGH.
16
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