Figure 120. Boundary-scan Cells for Oscillators and Clock Options
XTAL1/TOSC1
XTAL2/TOSC2
To
Next
Cell
To
ShiftDR
EXTEST
Next
Cell
Oscillator
ShiftDR
0
1
ENABLE
OUTPUT
0
1
FF1
D
Q
D
G
Q
0
1
D
Q
From
ClockDR
UpdateDR
Previous
Cell
From
ClockDR
Previous
Cell
Table 89 summaries the scan registers for the external clock pin XTAL1, Oscillators with
XTAL1/XTAL2 connections as well as 32 kHz Timer Oscillator.
Table 89. Scan Signals for the Oscillators(1)(2)(3)
Scanned Clock Line
Enable Signal Scanned Clock Line Clock Option
when not Used
EXTCLKEN
OSCON
EXTCLK (XTAL1)
OSCCK
External Clock
0
0
External Crystal
External Ceramic
Resonator
RCOSCEN
OSC32EN
TOSKON
RCCK
External RC
1
0
0
OSC32CK
TOSCK
Low Freq. External Crystal
32 kHz Timer Oscillator
Notes: 1. Do not enable more than one clock source as main clock at a time.
2. Scanning an Oscillator output gives unpredictable results as there is a frequency drift
between the Internal Oscillator and the JTAG TCK clock. If possible, scanning an
external clock is preferred.
3. The clock configuration is programmed by fuses. As a fuse is not changed run-time,
the clock configuration is considered fixed for a given application. The user is advised
to scan the same clock option as to be used in the final system. The enable signals
are supported in the scan chain because the system logic can disable clock options
in sleep modes, thereby disconnecting the Oscillator pins from the scan path if not
provided. The INTCAP fuses are not supported in the scan-chain, so the boundary
scan chain can not make a XTAL Oscillator requiring internal capacitors to run unless
the fuse is correctly programmed.
Scanning the Analog
Comparator
The relevant Comparator signals regarding Boundary-scan are shown in Figure 121.
The Boundary-scan cell from Figure 122 is attached to each of these signals. The sig-
nals are described in Table 90.
The Comparator need not be used for pure connectivity testing, since all analog inputs
are shared with a digital port pin as well.
232
ATmega32(L)
2503J–AVR–10/06