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ATMEGA2560-16AU-SL383 参数 Datasheet PDF下载

ATMEGA2560-16AU-SL383图片预览
型号: ATMEGA2560-16AU-SL383
PDF下载: 下载PDF文件 查看货源
内容描述: [Microcontroller, 8-Bit, FLASH, AVR RISC CPU, 16MHz, CMOS, PQFP100, 14 X 14 MM, 1 MM HEIGHT, 0.50 MM PITCH, GREEN, PLASTIC, MS-026AED, TQFP-100]
分类和应用: 时钟微控制器
文件页数/大小: 448 页 / 7518 K
品牌: ATMEL [ ATMEL ]
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ATmega640/1280/1281/2560/2561  
27. JTAG Interface and On-chip Debug System  
27.1 Features  
JTAG (IEEE std. 1149.1 Compliant) Interface  
Boundary-scan Capabilities According to the IEEE std. 1149.1 (JTAG) Standard  
Debugger Access to:  
– All Internal Peripheral Units  
– Internal and External RAM  
– The Internal Register File  
– Program Counter  
– EEPROM and Flash Memories  
Extensive On-chip Debug Support for Break Conditions, Including  
– AVR Break Instruction  
– Break on Change of Program Memory Flow  
– Single Step Break  
– Program Memory Break Points on Single Address or Address Range  
– Data Memory Break Points on Single Address or Address Range  
Programming of Flash, EEPROM, Fuses, and Lock Bits through the JTAG Interface  
On-chip Debugging Supported by AVR Studio®  
27.2 Overview  
The AVR IEEE std. 1149.1 compliant JTAG interface can be used for  
Testing PCBs by using the JTAG Boundary-scan capability  
Programming the non-volatile memories, Fuses and Lock bits  
On-chip debugging  
A brief description is given in the following sections. Detailed descriptions for Programming via  
the JTAG interface, and using the Boundary-scan Chain can be found in the sections “Program-  
ming via the JTAG Interface” on page 357 and “IEEE 1149.1 (JTAG) Boundary-scan” on page  
303, respectively. The On-chip Debug support is considered being private JTAG instructions,  
and distributed within ATMEL and to selected third party vendors only.  
Figure 27-1 shows a block diagram of the JTAG interface and the On-chip Debug system. The  
TAP Controller is a state machine controlled by the TCK and TMS signals. The TAP Controller  
selects either the JTAG Instruction Register or one of several Data Registers as the scan chain  
(Shift Register) between the TDI – input and TDO – output. The Instruction Register holds JTAG  
instructions controlling the behavior of a Data Register.  
The ID-Register, Bypass Register, and the Boundary-scan Chain are the Data Registers used  
for board-level testing. The JTAG Programming Interface (actually consisting of several physical  
and virtual Data Registers) is used for serial programming via the JTAG interface. The Internal  
Scan Chain and Break Point Scan Chain are used for On-chip debugging only.  
297  
2549L–AVR–08/07  
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