23. Electrical Characteristics
23.1 Absolute Maximum Ratings
*NOTICE:
Stressing the device beyond the “Absolute Maxi-
mum Ratings” may cause permanent damage.
These are stress ratings only. Operation beyond
the “operating conditions” is not recommended
and extended exposure beyond the “Operating
Conditions” may affect device reliability.
Storage Temperature..................................... -65°C to +150°C
Voltage on any other Pin to VSS .....................................-0.3to+4.0V
IOL per I/O Pin ................................................................. 5 mA
Power Dissipation............................................................. 1 W
Ambient Temperature Under Bias.................... -40°C to +85°C
VDD ....................................................................................... 2.7V to 3.3V
23.2 DC Characteristics
23.2.1
Digital Logic
Table 103. Digital DC Characteristics
VDD = 2.7 to 3.3V , TA = -40 to +85°C
Symbol
VIL
Parameter
Min
-0.5
Typ(1)
Max
0.2·VDD - 0.1
VDD
Units
Test Conditions
Input Low Voltage
V
V
V
VIH1
Input High Voltage (except RST, X1)
Input High Voltage (RST, X1)
0.2·VDD + 1.1
(2)
VIH2
0.7·VDD
VDD + 0.5
Output Low Voltage
VOL1
(except P0, ALE, MCMD, MDAT, MCLK,
SCLK, DCLK, DSEL, DOUT)
0.45
0.45
V
IOL= 1.6 mA
Output Low Voltage
(P0, ALE, MCMD, MDAT, MCLK, SCLK,
DCLK, DSEL, DOUT)
VOL2
V
V
IOL= 3.2 mA
Output High Voltage
(P1, P2, P3, P4 and P5)
VOH1
V
DD - 0.7
IOH= -30 µA
Output High Voltage
(P0, P2 address mode, ALE, MCMD,
MDAT, MCLK, SCLK, DCLK, DSEL,
DOUT, D+, D-)
VOH2
VDD - 0.7
V
IOH= -3.2 mA
Vin = 0.45 V
Logical 0 Input Current (P1, P2, P3, P4
and P5)
IIL
-50
µA
154
AT89C5132
4173E–USB–09/07