AT8xC51SND2C
Electrical Characteristics
Absolute Maximum Rating
*NOTICE:
Stressing the device beyond the “Absolute Maxi-
mum Ratings” may cause permanent damage.
These are stress ratings only. Operation beyond
the “operating conditions” is not recommended
and extended exposure beyond the “Operating
Conditions” may affect device reliability.
Storage Temperature......................................... -65 to +150°C
Voltage on any other Pin to VSS .................................... -0.3 to +4.0 V
IOL per I/O Pin ................................................................. 5 mA
Power Dissipation............................................................. 1 W
Operating Conditions
Ambient Temperature Under Bias........................ -40 to +85°C
VDD ......................................................................................................... 2.7 to 3.3V
DC Characteristics
Digital Logic
Table 181. Digital DC Characteristics
V
DD = 2.7 to 3.3 V, TA = -40 to +85°C
Symbol
Parameter
Min
-0.5
Typ(1)
Max
0.2·VDD - 0.1
VDD
Units
Test Conditions
VIL
Input Low Voltage
V
V
V
(2)
VIH1
Input High Voltage (except RST, X1)
Input High Voltage (RST, X1)
0.2·VDD + 1.1
0.7·VDD
VIH2
VDD + 0.5
Output Low Voltage
VOL1
(except P0, ALE, MCMD, MDAT, MCLK,
SCLK, DCLK, DSEL, DOUT)
0.45
0.45
V
I
I
OL= 1.6 mA
OL= 3.2 mA
Output Low Voltage
(P0, ALE, MCMD, MDAT, MCLK, SCLK,
DCLK, DSEL, DOUT)
VOL2
V
V
Output High Voltage
(P1, P2, P3, P4 and P5)
VOH1
V
V
DD - 0.7
IOH= -30 µA
Output High Voltage
(P0, P2 address mode, ALE, MCMD,
MDAT, MCLK, SCLK, DCLK, DSEL,
DOUT, D+, D-)
VOH2
DD - 0.7
V
IOH= -3.2 mA
Logical 0 Input Current (P1, P2, P3, P4
and P5)
IIL
-50
10
µA
µA
µA
VIN= 0.45 V
0.45< VIN< VDD
VIN= 2.0 V
Input Leakage Current (P0, ALE, MCMD,
MDAT, MCLK, SCLK, DCLK, DSEL,
DOUT)
ILI
Logical 1 to 0 Transition Current
(P1, P2, P3, P4 and P5)
ITL
-650
200
RRST
CIO
Pull-Down Resistor
Pin Capacitance
50
90
10
kΩ
pF
V
TA= 25°C
VRET
VDD Data Retention Limit
1.8
201
4341D–MP3–04/05
ATMEL [ ATMEL ]
