APA2030/2031
Reliability Test Program
Test item
Method
Description
245°C, 5 SEC
1000 Hrs Bias #125°C
168 Hrs, 100%RH, 121°C
-65°Ca150°C, 200 Cycles
VHBM ! 2KV, VMM ! 200V
10ms, 1tr ! 100mA
SOLDERABILITY
HOLT
MIL-STD-883D-2003
MIL-STD-883D-1005.7
JESD-22-B,A102
PCT
TST
MIL-STD-883D-1011.9
MIL-STD-883D-3015.7
JESD 78
ESD
Latch-Up
Carrier Tape & Reel Dimensions
t
D
P
Po
E
F
P1
Bo
W
Ao
D1
Ko
T2
J
C
A
B
T1
A
330 1
F
B
C
J
T1
T2
W
P
E
Application
TSSOP- 24
100 ref
D
13 0.5
D1
2 0.5
Po
16.4 0.2
P1
2 0.2
Ao
16 0.3
Bo
12 0.1 1.75 0.1
Ko
t
7.5 0.1
1.5 +0.1
1.5 min
4.0 0.1
2.0 0.1
6.9 0.1
8.3 0.1
1.5 0.1 0.3 0.05
(mm)
Copyright ANPEC Electronics Corp.
26
www.anpec.com.tw
Rev. A.2 - Apr., 2004
ANPEC [ ANPEC ELECTRONICS COROPRATION ]
