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A25L080Q4-UFG 参数 Datasheet PDF下载

A25L080Q4-UFG图片预览
型号: A25L080Q4-UFG
PDF下载: 下载PDF文件 查看货源
内容描述: 16Mbit的低电压,串行闪存的100MHz统一4KB扇区 [16Mbit Low Voltage, Serial Flash Memory With 100MHz Uniform 4KB Sectors]
分类和应用: 闪存
文件页数/大小: 43 页 / 681 K
品牌: AMICC [ AMIC TECHNOLOGY ]
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A25L016 Series  
INSTRUCTIONS  
All instructions, addresses and data are shifted in and out of  
the device, most significant bit first.  
can be driven High after any bit of the data-out sequence is  
being shifted out.  
In the case of a Page Program (PP), Sector Erase (SE), Block  
Erase (BE), Chip Erase (CE), Write Status Register (WRSR),  
Write Enable (WREN), Write Disable (WRDI) or Deep  
Serial Data Input (DIO) is sampled on the first rising edge of  
Serial Clock (C) after Chip Select ( ) is driven Low. Then, the  
S
one-byte instruction code must be shifted in to the device,  
most significant bit first, on Serial Data Input (DIO), each bit  
being latched on the rising edges of Serial Clock (C).  
Power-down (DP) instruction, Chip Select ( ) must be driven  
S
High exactly at a byte boundary, otherwise the instruction is  
The instruction set is listed in Table 3.  
rejected, and is not executed. That is, Chip Select ( ) must  
S
Every instruction sequence starts with a one-byte instruction  
code. Depending on the instruction, this might be followed by  
address bytes, or by data bytes, or by both or none.  
In the case of a Read Data Bytes (READ), Read Data Bytes at  
Higher Speed (Fast_Read), Read Identification (RDID), Read  
Electronic Manufacturer and Device Identification (REMS),  
Read Status Register (RDSR) or Release from Deep  
Power-down, Read Device Identification and Read Electronic  
Signature (RES) instruction, the shifted-in instruction se-  
driven High when the number of clock pulses after Chip Select  
(
) being driven Low is an exact multiple of eight.  
S
All attempts to access the memory array during a Write Status  
Register cycle, Program cycle or Erase cycle are ignored, and  
the internal Write Status Register cycle, Program cycle or  
Erase cycle continues unaffected.  
quence is followed by a data-out sequence. Chip Select (  
)
S
Table 3. Instruction Set  
One-byte  
Instruction Code  
Address  
Bytes  
Dummy  
Bytes  
Data  
Bytes  
Instruction  
WREN  
Description  
Write Enable  
Write Disable  
0000 0110  
0000 0100  
0000 0101  
0000 0001  
0000 0011  
0000 1011  
06h  
04h  
05h  
01h  
03h  
0Bh  
0
0
0
0
3
3
0
0
0
0
0
1
0
WRDI  
0
RDSR  
Read Status Register  
Write Status Register  
1 to  
1
WRSR  
READ  
Read Data Bytes  
1 to ∞  
1 to ∞  
FAST_READ  
Read Data Bytes at Higher Speed  
FAST_READ_DUAL  
_OUTPUT  
Read Data Bytes at Higher Speed by  
Dual Output (1)  
00111011  
10111011  
3Bh  
BBh  
3
1
1 to ∞  
1 to ∞  
FAST_READ_DUAL  
_INPUT-OUTPUT  
Read Data Bytes at Higher Speed by  
Dual Input and Dual Output (1)  
3(2)  
1(2)  
PP  
Page Program  
Sector Erase  
0000 0010  
0010 0000  
1101 1000  
1100 0111  
1011 1001  
1001 1111  
02h  
20h  
D8h  
C7h  
B9h  
9Fh  
3
3
3
0
0
0
0
0
0
0
0
0
1 to 256  
SE  
0
BE  
Block Erase  
0
0
CE  
Chip Erase  
DP  
Deep Power-down  
Read Device Identification  
0
RDID  
1 to ∞  
Read Electronic Manufacturer & Device  
Identification  
REMS  
1001 0000  
90h  
1(3)  
2
1 to ∞  
Release from Deep Power-down, and  
Read Electronic Signature  
0
0
3
0
1 to ∞  
RES  
1010 1011  
ABh  
Release from Deep Power-down  
0
Note: (1) DIO = (D6, D4, D2, D0)  
DO = (D7, D5, D3, D1)  
(2) Dual Input, DIO = (A22, A20, A18, ………, A6, A4, A2, A0)  
DO = (A23, A21, A19, …….., A7, A5, A3, A1)  
(3) ADD= (00h) will output manufacturer’s ID first and ADD=(01h) will output device ID first  
(March, 2012, Version 2.0)  
10  
AMIC Technology Corp.  
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