N64S0818HDA/N64S0830HDA
Advance Information
AMI Semiconductor, Inc.
1
Absolute Maximum Ratings
Item
Symbol
VIN,OUT
VCC
Rating
–0.3 to VCC+0.3
–0.3 to 4.5
500
Unit
V
Voltage on any pin relative to VSS
Voltage on VCC Supply Relative to VSS
Power Dissipation
V
PD
mW
oC
oC
oC
TSTG
Storage Temperature
–40 to 125
TA
Operating Temperature
-40 to +85
260oC, 10sec
TSOLDER
Soldering Temperature and Time
1. Stresses greater than those listed above may cause permanent damage to the device. This is a stress rating only and functional
operation of the device at these or any other conditions above those indicated in the operating section of this specification is not
implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability.
Operating Characteristics (Over Specified Temperature Range)
Typ1
Item
Symbol
Test Conditions
Min.
Max
Unit
VCC
VCC
VIH
Supply Voltage
Supply Voltage
1.8V Device
3V Device
1.7
2.3
0.7 x VCC
1.95
3.6
VCC+0.3
0.3 x VCC
V
V
Input High Voltage
Input Low Voltage
Output High Voltage
Output Low Voltage
Input Leakage Current
Output Leakage Current
V
VIL
–0.3
VCC–0.5
V
VOH
VOL
ILI
IOH = -0.4mA
IOL = 1mA
V
0.2
0.5
0.5
500
4
V
CS = VCC, VIN = 0 to VCC
CS = VCC, VOUT = 0 to VCC
F = 1MHz, IOUT = 0
F = 10MHz, IOUT = 0
F = 20/25MHz, IOUT = 0
µA
µA
µA
mA
mA
ILO
ICC1
ICC2
ICC3
Read/Write Operating
Current
8/10
1.8V Device
200
1
500
3
nA
CS = VCC, VIN = VSS or VCC
ISB
Standby Current
3V Device
CS = VCC, VIN = VSS or VCC
µA
1. Typical values are measured at Vcc=Vcc Typ., TA=25°C and are not 100% tested.
1
Capacitance
Item
Symbol
CIN
Test Condition
Min
Max
7
Unit
pF
VIN = 0V, f = 1 MHz, TA = 25oC
VIN = 0V, f = 1 MHz, TA = 25oC
Input Capacitance
I/O Capacitance
CI/O
7
pF
1. These parameters are verified in device characterization and are not 100% tested
3
This is a developmental specification and is subject to change without notice.
AMI [ AMI SEMICONDUCTOR ]
