AMD
P R E L I M I N A R Y
AC CHARACTERISTICS
OPERATING RANGES
Commercial (C) Devices
5.0 V MEMORY BUS INTERFACE
Temperature (TA) . . . . . . . . . . . . . . . . . 0°C to + 70°C
ABSOLUTE MAXIMUM RATINGS
Supply Voltages (VCC, VDDT, VDDU1, VDDU2, VDDM, VDDP)
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4.75 V to 5.25 V
Storage Temperature: . . . . . . . . . . . . –65 to +150°C
Ambient Temperature Under Bias: . . . –65 to +125°C
Supply Voltages
(AVDD, VDD5) . . . . . . . . . . . . . . . . . . . . . . . . +5 V ± 5%
Supply Voltage to AVSS
or DVSS (AVDD, DVDD): . . . . . . . . . . . . . . –0.3 to +6 V
All inputs within the range: VSS – 0.5 V ≤ VIN ≤ VDD + 0.1 X
VDD – where VSS and VDD are appropriate reference pins
for a given input pin. (See section on power supply
pin descriptions.)
Stresses above those listed under Absolute Maximum
Ratings may cause permanent device failure. Functionality at
or above these limits is not implied. Exposure to Absolute
Maximum Ratings for extended periods may affect
device reliability.
CL = 50 pF unless otherwise noted
Operating ranges define those limits between which the func-
tionality of the device is guaranteed.
MEMORY BUS READ ACCESS
Parameter
Symbol
Parameter Description
Test Conditions
Min
2
Max
60
Unit
ns
tmAD
MA[16:0] valid from CLKIN ↓
CE active delay from CLKIN ↓
MOE active delay from CLKIN ↓
tmCD
Note 1
2
60
ns
tmOD
2
60
ns
tmOLZ
MOE ↓ to MD[7:0] driven
(Note 3)
0 wait states
1 wait state
2 wait states
0
30
80
130
ns
ns
ns
tmAA
tmACS
tmOE
Address Read Access Time
(Note 3)
0 wait states
1 wait state
2 wait states
55
105
155
ns
ns
ns
CE Read Access Time
(Notes 1, 3)
0 wait states
1 wait state
2 wait states
55
105
155
ns
ns
ns
MOE Read Access Time
(Note 3)
0 wait states
1 wait state
2 wait states
30
80
130
ns
ns
ns
tmRI
tmAH
tmCH
tmH
CE Inactive Time
Notes 1, 2
Note 1
0
ns
ns
ns
ns
ns
MA[16:0] valid hold from MOE ↑
CE valid hold from MOE ↑
MD[7:0] valid hold from MOE ↑
MD[7:0] inactive from MOE ↑
TCLKIN-10
TCLKIN-10
Note 2
Note 2
0
0
tmHZ
2 X TCLKIN-15
Notes:
1. CE = one of: FCE, SCE, XCE
2. Parameter not included in the production test.
3. Value is dependent upon TCLKIN value. Value given is for CLKIN = 40 MHz.
Am79C930
137
AMD [ AMD ]
