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AM29F016D-70EF 参数 Datasheet PDF下载

AM29F016D-70EF图片预览
型号: AM29F016D-70EF
PDF下载: 下载PDF文件 查看货源
内容描述: 16兆位(2M ×8位) CMOS 5.0伏只,统一部门快闪记忆体 [16 Megabit (2 M x 8-Bit) CMOS 5.0 Volt-only, Uniform Sector Flash Memory]
分类和应用:
文件页数/大小: 43 页 / 1326 K
品牌: AMD [ AMD ]
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D A T A S H E E T  
GENERAL DESCRIPTION  
The Am29F016D is a 16 Mbit, 5.0 volt-only Flash mem-  
ory organized as 2,097,152 bytes. The 8 bits of data  
appear on DQ0–DQ7. The Am29F016D is offered in  
48-pin TSOP, 40-pin TSOP, and 44-pin SO packages.  
The device is also available in Known Good Die (KGD)  
form. For more information, refer to publication number  
21551. This device is designed to be programmed  
algorithm—an internal algorithm that automatically  
preprograms the array (if it is not already programmed)  
before executing the erase operation. During erase, the  
device automatically times the erase pulse widths and  
verifies proper cell margin.  
The host system can detect whether a program or  
erase operation is complete by observing the RY/BY#  
pin, or by reading the DQ7 (Data# Polling) and DQ6  
(toggle) status bits. After a program or erase cycle has  
been completed, the device is ready to read array data  
or accept another command.  
in-system with the standard system 5.0 volt V supply.  
CC  
A 12.0 volt V is not required for program or erase  
PP  
operations. The device can also be programmed in  
standard EPROM programmers.  
This device is manufactured using AMD’s 0.23 µm pro-  
cess technology, and offers all the features and  
benefits of the Am29F016, which was manufactured  
using 0.5 µm process technology.  
The sector erase architecture allows memory sectors  
to be erased and reprogrammed without affecting the  
data contents of other sectors. The device is fully  
erased when shipped from the factory.  
The standard device offers access times of 70, 90, and  
120 ns, allowing high-speed microprocessors to oper-  
ate without wait states. To eliminate bus contention, the  
device has separate chip enable (CE#), write enable  
(WE#), and output enable (OE#) controls.  
Hardware data protection measures include a low  
V
detector that automatically inhibits write opera-  
CC  
tions during power transitions. The hardware sector  
protection feature disables both program and erase  
operations in any combination of the sectors of mem-  
ory. This can be achieved via programming equipment.  
The device requires only a single 5.0 volt power sup-  
ply for both read and write functions. Internally  
generated and regulated voltages are provided for the  
program and erase operations.  
The Erase Suspend feature enables the user to put  
erase on hold for any period of time to read data from,  
or program data to, any sector that is not selected for  
erasure. True background erase can thus be achieved.  
The device is entirely command set compatible with the  
JEDEC single-power-supply Flash standard. Com-  
mands are written to the command register using  
standard microprocessor write timings. Register con-  
tents serve as input to an internal state-machine that  
controls the erase and programming circuitry. Write cy-  
cles also internally latch addresses and data needed  
for the programming and erase operations. Reading  
data out of the device is similar to reading from other  
Flash or EPROM devices.  
The hardware RESET# pin terminates any operation  
in progress and resets the internal state machine to  
reading array data. The RESET# pin may be tied to the  
system reset circuitry. A system reset would thus also  
reset the device, enabling the system microprocessor  
to read the boot-up firmware from the Flash memory.  
The system can place the device into the standby  
mode. Power consumption is greatly reduced in  
this mode.  
Device programming occurs by executing the program  
command sequence. This initiates the Embedded  
Program algorithm—an internal algorithm that auto-  
matically times the program pulse widths and verifies  
proper cell margin.  
AMD’s Flash technology combines years of Flash  
memory manufacturing experience to produce the  
highest levels of quality, reliability and cost effective-  
ness. The device electrically erases all bits within a  
sector simultaneously via Fowler-Nordheim tunneling.  
The data is programmed using hot electron injection.  
Device erasure occurs by executing the erase com-  
mand sequence. This initiates the Embedded Erase  
2
Am29F016D  
21444E6 November 1, 2006  
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