QT2022/32 - Data Sheet: DS3051
11.8.2 TAP Port
Table 44 lists the supported BSCAN instructions while Table 45 lists the unsupported BSCAN instructions..
Table 44: Supported BSCAN Instructions
BSCAN Instruction
BYPASS
Value
Description
5’b11111
5’b00000
5’b00001
5’b00010
5’b00011
5’b00100
5’b01001
5’b00110
5’b00101
bypasses the bscan register
DC test of external connectivity to I/O
allows reading the device ID register
captures and updates data
EXTEST
IDCODE
SAMPLE/PRELOAD
RUNBIST
runs BIST on internal memories
debug mode of memory BIST
SCAN test on digital core
DEBUGBIST
SCAN
EXTEST_TRAIN
EXTEST_PULSE
AC test of external connectivity to I/O
AC test of external connectivity to I/O
.
Table 45: Unsupported BSCAN Instructions
BSCAN Instruction
CLAMP
Description
allows outputs to be forced to specific states during BYPASS
allows outputs to be forced into high-z state
HIGHZ
INTEST
allows testing of internal circuitry using BSCAN chain
allows a user-programmable ID code
USERCODE
11.8.3 Device ID register
Table 46: Device ID Register
Field
Value
Manufacturer’s ID code (11bits)
Part-number code (16 bits)
Version code (4 bits)
11’b0101_0110100
16’h2032 (16’b0010_0000_0011_0010)
4’hA (4’b1010)
.
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