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EP1S20F672C7N 参数 Datasheet PDF下载

EP1S20F672C7N图片预览
型号: EP1S20F672C7N
PDF下载: 下载PDF文件 查看货源
内容描述: [Field Programmable Gate Array, 2132 CLBs, 18460-Cell, CMOS, PBGA672, 35 X 35 MM, 1.27 MM PITCH, LEAD FREE, BGA-672]
分类和应用:
文件页数/大小: 292 页 / 1528 K
品牌: ALTERA [ ALTERA CORPORATION ]
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IEEE Std. 1149.1 (JTAG) Boundary-Scan Support  
Table 3–1. Stratix JTAG Instructions  
JTAG Instruction  
Instruction Code  
Description  
SAMPLE/PRELOAD 00 0000 0101  
Allows a snapshot of signals at the device pins to be captured and  
examined during normal device operation, and permits an initial  
data pattern to be output at the device pins. Also used by the  
SignalTap II embedded logic analyzer.  
EXTEST (1)  
BYPASS  
00 0000 0000  
11 1111 1111  
00 0000 0111  
Allows the external circuitry and board-level interconnects to be  
tested by forcing a test pattern at the output pins and capturing test  
results at the input pins.  
Places the 1-bit bypass register between the TDIand TDOpins,  
which allows the BST data to pass synchronously through selected  
devices to adjacent devices during normal device operation.  
USERCODE  
Selects the 32-bit USERCODEregister and places it between the  
TDIand TDOpins, allowing the USERCODEto be serially shifted  
out of TDO.  
IDCODE  
00 0000 0110  
00 0000 1011  
Selects the IDCODEregister and places it between TDIand TDO,  
allowing the IDCODEto be serially shifted out of TDO.  
HIGHZ(1)  
Places the 1-bit bypass register between the TDIand TDOpins,  
which allows the BST data to pass synchronously through selected  
devices to adjacent devices during normal device operation, while  
tri-stating all of the I/O pins.  
00 0000 1010  
CLAMP(1)  
Places the 1-bit bypass register between the TDIand TDOpins,  
which allows the BST data to pass synchronously through selected  
devices to adjacent devices during normal device operation while  
holding I/O pins to a state defined by the data in the boundary-scan  
register.  
ICR instructions  
Used when configuring an Stratix device via the JTAG port with a  
MasterBlasterTM, ByteBlasterMVTM, or ByteBlasterTM II download  
cable, or when using a Jam File or Jam Byte-Code File via an  
embedded processor or JRunner.  
PULSE_NCONFIG 00 0000 0001  
Emulates pulsing the nCONFIGpin low to trigger reconfiguration  
even though the physical pin is unaffected.  
CONFIG_IO  
00 0000 1101  
Allows configuration of I/O standards through the JTAG chain for  
JTAG testing. Can be executed before, after, or during  
configuration. Stops configuration if executed during configuration.  
Once issued, the CONFIG_IOinstruction will hold nSTATUSlow  
to reset the configuration device. nSTATUSis held low until the  
device is reconfigured.  
SignalTap II  
instructions  
Monitors internal device operation with the SignalTap II embedded  
logic analyzer.  
Note to Table 3–1:  
(1) Bus hold and weak pull-up resistor features override the high-impedance state of HIGHZ, CLAMP, and EXTEST.  
3–2  
Altera Corporation  
July 2005  
Stratix Device Handbook, Volume 1  
 
 
 
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