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5M160ZT100I5 参数 Datasheet PDF下载

5M160ZT100I5图片预览
型号: 5M160ZT100I5
PDF下载: 下载PDF文件 查看货源
内容描述: [Flash PLD, 14ns, PQFP100, 16 X 16 MM, 0.50 MM PITCH, TQFP-100]
分类和应用: 时钟可编程逻辑
文件页数/大小: 166 页 / 4004 K
品牌: ALTERA [ ALTERA CORPORATION ]
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8–10  
Chapter 8: JTAG Boundary-Scan Testing in MAX V Devices  
IEEE Std. 1149.1 BST Operation Control  
Figure 8–9 shows that the test data that shifted into TDIdoes not appear at the TDOpin  
until after the capture register data that is shifted out. If TMSis held high on two  
consecutive TCKclock cycles, the TAP controller advances to the UPDATE_DRstate for  
the update phase.  
If you enable the device output enable feature but the DEV_OEpin is not asserted  
during boundary-scan testing, the output enable boundary-scan registers of the BSCs  
capture data from the core of the device during SAMPLE/PRELOAD. These values are not  
high impedance, although the I/O pins are tri-stated.  
Figure 8–9 shows the SAMPLE/PRELOADwaveforms.  
Figure 8–9. SAMPLE/PRELOAD Shift Data Register Waveforms  
TCK  
TMS  
TDI  
TDO  
SHIFT_IR  
SHIFT_DR  
TAP_STATE  
EXIT1_IR  
UPDATE_IR  
EXIT1_DR  
SELECT_DR_SCAN  
After boundry-scan  
register data has been  
shifted out, data  
entered into TDI will  
shift out of TDO.  
Data stored in  
boundary-scan  
register is shifted  
out of TDO.  
Instruction Code  
UPDATE_DR  
CAPTURE_DR  
EXTEST Instruction Mode  
Use EXTESTinstruction mode to check the external pin connections between devices.  
Unlike SAMPLE/PRELOADmode, EXTESTallows test data to be forced onto the pin  
signals. By forcing known logic high and low levels on output pins, you can detect  
opens and shorts at pins of any device in the scan chain.  
EXTESTselects data differently than SAMPLE/PRELOAD. EXTESTchooses data from the  
update registers as the source of the output and output enable signals. After the  
EXTESTinstruction code is entered, the multiplexers select the update register data;  
thus, you can force the data stored in these registers from a previous EXTESTor  
SAMPLE/PRELOADtest cycle onto the pin signals. In the capture phase, the results of this  
test data are stored in the capture registers and then shifted out of TDOduring the shift  
phase. You can store the new test data in the update registers during the update  
phase.  
MAX V Device Handbook  
December 2010 Altera Corporation  
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