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5M160ZT100I5 参数 Datasheet PDF下载

5M160ZT100I5图片预览
型号: 5M160ZT100I5
PDF下载: 下载PDF文件 查看货源
内容描述: [Flash PLD, 14ns, PQFP100, 16 X 16 MM, 0.50 MM PITCH, TQFP-100]
分类和应用: 时钟可编程逻辑
文件页数/大小: 166 页 / 4004 K
品牌: ALTERA [ ALTERA CORPORATION ]
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8–14  
Chapter 8: JTAG Boundary-Scan Testing in MAX V Devices  
Boundary-Scan Test for Programmed Devices  
levels, the devices can interface with each other. For example, a device with 3.3-V  
VCCIO can drive to a device with 5.0-V VCCIO because 3.3 V meets the minimum VIH on  
transistor-to-transistor logic (TTL)-level input for the 5.0-V VCCIO device. JTAG pins  
on MAX V devices can support 1.5-, 1.8-, 2.5-, or 3.3-V input levels, depending on the  
VCCIO voltage of I/O Bank 1.  
f For more information about MultiVolt I/O support, refer to the MAX V Device  
Architecture chapter.  
You can interface the TDIand TDOlines of the JTAG pins of devices that have different  
VCCIO levels by inserting a level shifter between the devices. If possible, the JTAG  
chain must be built such that a device with a higher VCCIO level drives to a device with  
an equal or lower VCCIO level. By building the JTAG chain in this manner, a level  
shifter may be required only to shift the TDOlevel to a level acceptable to the JTAG  
tester.  
Figure 8–13 shows the JTAG chain of mixed voltages and how a level shifter is  
inserted in the chain.  
Figure 8–13. JTAG Chain of Mixed Voltages  
Must be 5.0-V  
Tolerant  
Must be 3.3-V  
Tolerant  
TDI  
5.0-V  
3.3-V  
2.5-V  
V
V
V
CCIO  
CCIO  
CCIO  
Tester  
TDO  
Level  
1.5-V  
1.8-V
Shifter  
V
V
CCIO  
CCIO
Shift TDO to Level  
Accepted by Tester  
if Necessary  
Must be 1.8-V  
Tolerant  
Must be 2.5-V  
Tolerant  
Boundary-Scan Test for Programmed Devices  
For a programmed device, the input buffers are turned off by default for I/O pins that  
are set as output only in the design file. You cannot sample on the programmed device  
output pins with the default boundary-scan description language (BSDL) file when  
the input buffers are turned off.  
For boundary-scan testing, you can set the Quartus II software to always enable the  
input buffers on a programmed device so it behaves the same as an unprogrammed  
device, allowing sample function on output pins in the design. This aspect can cause  
slight increase in standby current as the unused input buffer is always on.  
To enable the unused input buffers on a programmed device, follow these steps:  
1. On the Assignments menu, click Settings.  
2. Under Category, select Assembler.  
3. Turn on Always Enable Input Buffers.  
MAX V Device Handbook  
December 2010 Altera Corporation  
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