Agilent Desktop EasyEXPERT Software
Prober control
Introduction
Agilent Desktop EasyEXPERT software
makes every user a parametric test
Supported 4155/4156
Functionality
All popular semiautomatic wafer probers
are supported by Desktop EasyEXPERT.
You can define wafer, die and module
information for probing across an entire
wafer. You can also combine wafer prober
control with either Quick Test mode or an
application test-based test sequence to
perform multiple testing on various devices
across the wafer.
Desktop EasyEXPERT Standard
edition
expert. The Microsoft® Windows®-based
interface is familiar, even to new engi-
neers who have limited experience using
parametric measurement instruments.
Its unique task-based approach enables
the user to focus on the real task-at-hand
(device characterization) without having
to be a specialist at using the instrument
hardware. Desktop EasyEXPERT supports
all aspects of parametric test, from basic
manual measurements to test automa-
tion across a wafer in conjunction with a
semiautomatic wafer prober.
• Staircase Sweep
Desktop EasyEXPERT Plus edition
The following additional functions
are supported.
• I/V-t Sampling except Thinned-out and
Logarithmic modes
Automatic data export
Desktop EasyEXPERT has the ability to
automatically export measurement data in
real time, in a variety of formats. You can
save data to any drive connected to the
PC. If you wish, you can export data to a
network drive and view test results on your
desktop PC at the same time your instru-
ments are performing testing in the lab.
• VSU/VMU except differential voltage
measurement using VMU
• PGU (41501B)
Each SMU can sweep using VAR1 (primary
sweep), VAR2 (secondary sweep), or
VAR1' (synchronous sweep).
Features and benefits
Staircase Sweep Measurement Mode
Forces swept voltage or current, and
measures DC voltage or current. A second
channel can be programmed to output
a pulsed bias voltage or current. A third
channel can be synchronized with the
primary sweep channel as an additional
voltage or current sweep source.
Number of Steps for VAR1 and VAR1': 1
to 1001
Number of Steps for VAR2: 1 to 128
Sweep type: Linear or logarithmic
Sweep direction: Single or double sweep
Hold Time: 0 to 655.35 s, 10 ms resolution
Delay Time: 0 to 65.5350 s, 100 μs
resolution
Large application test library
Desktop EasyEXPERT comes with more
than 230 application tests conveniently
organized by device type, application, and
technology. Many of these application
tests will run on the 4155 and 4156 without
modification. You also can easily edit and
customize the furnished application tests
to fit your specific needs.
Software Functions
Operation mode
Application test mode, Classic test mode,
Quick test mode
Key Functions
• Categorized and predefined application
library
• Device definition
Offline capability
• Measurement parameter settings
• Save/Recall My Favorite Setups
• Define/customize application library
• Execute measurement (Single/Repeat/
Append)
Desktop EasyEXPERT can run in either
online or offline mode. In offline mode you
can perform tasks such as analyzing data
and creating new application tests. This
frees up your existing analyzer from being
needed for development work and enables
you to use it for its primary purpose:
making measurements.
• Quick test execution
• Save/Recall measurement data and
settings
Pulsed Sweep Measurement Mode
This mode forces pulsed swept voltage
or current, and measures DC voltage
or current. A second channel can be
programmed to output a staircase sweep
voltage or current synchronized with the
pulsed sweep output.
• Test result data management
• Import/Export device definition, measure-
ment settings, my favorite setup,
measurement data, and application
library
GUI-based classic test mode
Desktop EasyEXPERT offers a classic
test mode that maintains the look, feel,
and terminology of the 4155/4156 user
interface. In addition, it improves the
4155/4156 user interface by taking full
advantage of the Windows GUI features.
• Graph plot display/analysis/printing
• Switching matrix control
• Workspace management
Easy test sequencing
Application Library
A GUI-based Quick Test mode lets you to
perform test sequencing without program-
ming. You can select, copy, rearrange and
cut-and-paste any application tests with a
few simple mouse clicks. Once you have
selected and arranged your tests, simply
click on the measurement button to begin
running an automated test sequence.
Category:
Sample test definitions for the following
applications. They are subject to change
without notice.
Structure, CMOS, Bipolar (BJT), TFT,
Discrete, Nanotechnology, Utility
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