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ATTL7554P-TR 参数 Datasheet PDF下载

ATTL7554P-TR图片预览
型号: ATTL7554P-TR
PDF下载: 下载PDF文件 查看货源
内容描述: L7554低功耗SLIC [L7554 Low-Power SLIC]
分类和应用:
文件页数/大小: 28 页 / 463 K
品牌: AGERE [ AGERE SYSTEMS ]
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Data Sheet  
March 1997  
L7554 Low-Power SLIC  
Electrical Characteristics (continued)  
Table 5. 2-Wire Port  
Parameter  
Min  
Typ  
Max  
Unit  
Tip or Ring Drive Current  
= dc + Longitudinal + Signal Currents  
15  
65  
15  
mA  
Signal Current  
mArms  
mArms  
Longitudinal Current Capability per Wire1  
8.5  
dc Loop Current Limit2  
RLOOP = 100 Ω  
Programmability Range  
Accuracy (20 mA < ILIM < 40 mA)  
5
ILIM  
45  
±12  
mA  
mA  
%
Powerup Open Loop Voltage Levels  
Common-mode Voltage  
VBAT/2  
V
Differential Voltage:  
VBAT = –48 V, Temperature = 25 °C  
VBAT = –72 V, Temperature = 85 °C (L7554BP)  
|VBAT + 7.0| |VBAT + 6.5| |VBAT + 6.0|  
V
V
|VBAT + 10.0| |VBAT + 6.8|  
Disconnect State  
PT Resistance (VBAT < VPT < 0 V)  
PR Resistance (VBAT < VPR < 0 V)  
143  
133  
100  
100  
kΩ  
kΩ  
Ground Start State  
PT Resistance  
143  
113  
100  
90  
kΩ  
dc Feed Resistance (for ILOOP below regulation level)  
133  
Loop Resistance Range (–3.17 dBm overload into  
600 ; not including protection)  
ILOOP = 20 mA at VBAT = –48 V  
1900  
700  
ILOOP = 20 mA at VBAT = –24 V  
Longitudinal to Metallic Balance—IEEE 3 Std. 455  
(See Figure 7.)4  
50 Hz to 1 kHz  
64  
60  
75  
70  
dB  
dB  
1 kHz to 3 kHz  
Metallic to Longitudinal Balance  
200 Hz to 4 kHz  
46  
dB  
RFI Rejection (See Figure 8.)5  
0.5 Vrms, 50 Source, 30% AM Mod. 1 kHz  
500 kHz to 100 MHz  
–55  
–45  
dBV  
1. The longitudinal current is independent of dc loop current.  
2. Current-limit ILIM is programmed by a resistor, RPROG, from pin IPROG to DCOUT. ILIM is specified at the loop resistance where current limiting  
begins (see Figure 25). Select RPROG (k) = 1.67 x ILIM (mA).  
3. IEEE is a registered trademark of The Institute of Electrical and Electronics Engineers, Inc.  
4. Longitudinal balance of circuit card will depend on loop series resistance matching (see Figures 23 and 24).  
5. This parameter is not tested in production. It is guaranteed by design and device characterization.  
8
Lucent Technologies Inc.  
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