AD±±70
SPECIFICATIONS
VDD = +11.ꢁ V to +16.5 V; VSS = −11.ꢁ V to −16.5 V; VREF = 5 V; REFGND = GND = 0 V; RL = 5 kΩ and CL = ꢀ00 pF to GND; all
specifications TMIN to TMAX, unless otherwise noted.
Table 1.
A/W Grade1, 2
B/Y Grade2
Typ3
Min
Typ3
Max
Min
Max
Parameter
Unit
Test Conditions/Comments
ACCURACY
Resolution
Monotonicity
Relative Accuracy (INL)
*
*
16
16
Bits
Bits
LSB
LSB
LSB
±0.6
±0.6
*
±0.4
±0.4
±0.3
±1
+1.25
+1
At 25°C
±2
*
−1
−1
Differential Nonlinearity
(DNL)
*
Negative Full-Scale Error
Full-Scale Error
Bipolar Zero Error
Gain Error
Gain Temperature
Coefficient4
*
*
*
*
*
*
*
*
*
*
±0.ꢀ
±1.ꢁ
±0.ꢀ
±1.ꢁ
0.25
±±.5
± 6
±±.5
±±.5
±1.5
mV
mV
mV
mV
ppm
FSR/°C
REFERENCE INPUT
Reference Input Range4
*
*
*
*
*
*
*
4
4
5
5
5
±
±0.1
V
V
µA
With ±11.4 V supplies
With ±16.5 V supplies
Input Current
OUTPUT CHARACTERISTICS4
Output Voltage Range
*
*
*
*
*
*
*
VSS + 1.4 V
VSS + 2.5 V
VDD − 1.4 V
VDD − 2.5 V
16
13
±
V
V
µs
µs
µs
V/µs
nV-s
±11.4 V supplies
±16.5 V supplies
At 16 bits to ±0.5 LSB
To 0.003%
512 LSB code change
Measured from 10% to ꢀ0%
Output Voltage Settling Time
Slew Rate
Digital-to-Analog Glitch
Impulse
*
*
*
*
*
12
10
6
6.5
15
±12 V suppliesꢂ 1 LSB change
around the major carry
Bandwidth
*
*
*
*
*
*
20
25
ꢁ5
0.35
0.5
12
kHz
mA
nV/Hz
Ω
nV-s
s
Short Circuit Current
Output Noise Voltage Density
DAC Output Impedance4
Digital Feedthrough
WARMUP TIME5
f = 1 kHzꢂ midscale loaded
*
0.5
LOGIC INPUTS
Input Current
*
*
±0.1
0.ꢁ
µA
V
V
VINH, Input High Voltage
VINL, Input Low Voltage
CIN, Input Capacitance4
LOGIC OUTPUTS
VOL, Output Low Voltage
Floating-State Output
Capacitance
*
2
*
*
3
ꢁ
pF
*
0.4
V
pF
ISINK = 1 mA
Rev. 0 | Page 3 of 24
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