欢迎访问ic37.com |
会员登录 免费注册
发布采购

5962-0421901QYC 参数 Datasheet PDF下载

5962-0421901QYC图片预览
型号: 5962-0421901QYC
PDF下载: 下载PDF文件 查看货源
内容描述: [Field Programmable Gate Array, 250000 Gates, 4224-Cell, CMOS, CQFP208, CERAMIC, QFP-208]
分类和应用: 可编程逻辑
文件页数/大小: 217 页 / 1554 K
品牌: ACTEL [ Actel Corporation ]
 浏览型号5962-0421901QYC的Datasheet PDF文件第39页浏览型号5962-0421901QYC的Datasheet PDF文件第40页浏览型号5962-0421901QYC的Datasheet PDF文件第41页浏览型号5962-0421901QYC的Datasheet PDF文件第42页浏览型号5962-0421901QYC的Datasheet PDF文件第44页浏览型号5962-0421901QYC的Datasheet PDF文件第45页浏览型号5962-0421901QYC的Datasheet PDF文件第46页浏览型号5962-0421901QYC的Datasheet PDF文件第47页  
MIL-PRF-38535K  
TABLE IV. Group C life tests .  
MIL-STD-883 test method and conditions  
Minimum sample size quantity (accept no.)  
Tests  
Subgroup  
Class Q  
(class level B)  
1/  
Class V  
(class level S)  
1/ 2/  
Class Y  
(class level S)  
1/ 2/  
Subgroup 1  
a. Steady-state life test a. TM 1005 45(0)  
1000 hours at 125°C  
a. TM 1005 45(0)  
a. TM 1005 45(0)  
1000 hours at 125°C  
1000 hours at 125°C  
b. End-point electrical  
parameters  
b. As specified in the  
applicable device  
b. As specified in the  
applicable device  
b. As specified in the  
applicable device  
procurement specification  
procurement specification  
procurement specification  
1/ Life test may be performed on a quantity (accept) criteria of 22(0) for 2000 hours at 125°C or equivalent per TM 1005 to attain  
44,000 device hours. For lots greater than 200, actual devices shall be used. For lots less than or equal to 200, the number  
of actual devices shall be the greater of 5 devices or 10 percent of the lot, and the SEC shall supplement actual devices to  
result in a sample of 22 unless acceptable group C data from the same lot of SEC is available for the previous 3 months. The  
SEC shall have been produced under equivalent conditions as the production lot and as close in time as feasible, but not to  
exceed a 3-months period.  
2/ Group C life tests shall be performed on the initial production lot of actual devices from each wafer lot, in accordance with  
table IV herein. Group C life tests are not required to be performed on subsequent production lots when all the following  
conditions are met:  
(a) Subsequent production lots utilize die from the same wafer lot as the initial production lot.  
(b) Wafers or die remaining from the initial production lot are to be stored in dry nitrogen or equivalent controlled storage,  
and in covered containers.  
(c) No major changes to the assembly processes have occurred since the group C test was performed on the wafer lot.  
Note: For ASICs, a sample size of 5 actual devices may be used with the balance being made up of the SEC.  
29  
 
 复制成功!