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5962-0421901QYC 参数 Datasheet PDF下载

5962-0421901QYC图片预览
型号: 5962-0421901QYC
PDF下载: 下载PDF文件 查看货源
内容描述: [Field Programmable Gate Array, 250000 Gates, 4224-Cell, CMOS, CQFP208, CERAMIC, QFP-208]
分类和应用: 可编程逻辑
文件页数/大小: 217 页 / 1554 K
品牌: ACTEL [ Actel Corporation ]
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MIL-PRF-38535K  
TABLE V. Group D tests (Package related test) .  
MIL-STD-883 test method and conditions  
Class V  
Subgroups test  
Tests 1/  
Class Q  
Class Y  
(class level B)  
(class level S)  
(class level S)  
Subgroup 1  
sample size 15(0)  
2/  
Physical dimensions  
TM 2016  
TM 2016  
TM 2016  
Where applicable  
a. TM 2004  
Where applicable  
a. TM 2004  
Where applicable  
a. TM 2004  
Subgroup 2  
sample size 45(0)  
2/ 3/  
a. Lead/terminal integrity  
test  
condition B2 (lead fatigue) condition B2 (lead fatigue) condition B2 (lead fatigue)  
or applicable for the  
or applicable for the  
or applicable for the  
package technology style  
package technology style  
package technology style  
b. Seal test 4/  
(1) Fine leak  
b. TM 1014  
Test condition as  
applicable  
b. TM 1014  
Test condition as  
applicable  
b. 5/  
(2) Gross leak  
c. For BGA/CGA packages  
c. BGA/CGA packages  
c. BGA/CGA packages  
c. BGA/CGA packages  
(i) Ball shear test for BGA  
package  
(i) For BGA package -  
JESD22-B117  
(i) For BGA package -  
JESD22-B117  
(i) For BGA package -  
JESD22-B117  
(45 balls from 2 devices  
minimum)  
(45 balls from 2 devices  
minimum)  
(45 balls from 2 devices  
minimum)  
(ii) Solder column pull test  
for CGA package  
(ii) For CGA package -  
TM 2038  
(ii) For CGA package -  
TM 2038  
(ii) For CGA package -  
TM 2038  
(45 columns from  
2 devices minimum)  
(45 columns from  
2 devices minimum)  
(45 columns from 2 devices  
minimum)  
Subgroup 3  
sample size 15(0)  
6/ 7/  
a. Thermal shock  
a. TM 1011  
a. TM 1011  
a. TM 1011  
Test condition B,  
15 cycles minimum  
Test condition B,  
15 cycles minimum  
Test condition B,  
15 cycles minimum  
b. Temperature cycling  
b. TM 1010  
b. TM 1010  
b. TM 1010  
Test condition C,  
100 cycles minimum  
Test condition C,  
100 cycles minimum  
Test condition C,  
100 cycles minimum  
c. Moisture resistance  
d. Visual examination  
c. TM 1004 8/  
c. TM 1004 8/  
c. HAST in accordance with  
JESD22-A118,  
condition B  
d. In accordance with  
visual criteria of  
d. In accordance with  
visual criteria of  
d. In accordance with visual  
criteria of TM 1004 or  
TM 1010  
TM 1004 or TM 1010  
TM 1004 or TM 1010  
e. Seal test 9/  
(1) Fine leak  
e. TM 1014 test condition e. TM 1014 test condition e. 5/  
as applicable  
as applicable  
(2) Gross leak  
f. End-point electrical  
parameters 10/  
f. As specified in the  
applicable device  
f. As specified in the  
applicable device  
f. As specified in the  
applicable device  
.
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