欢迎访问ic37.com |
会员登录 免费注册
发布采购

5962-0421901QYC 参数 Datasheet PDF下载

5962-0421901QYC图片预览
型号: 5962-0421901QYC
PDF下载: 下载PDF文件 查看货源
内容描述: [Field Programmable Gate Array, 250000 Gates, 4224-Cell, CMOS, CQFP208, CERAMIC, QFP-208]
分类和应用: 可编程逻辑
文件页数/大小: 217 页 / 1554 K
品牌: ACTEL [ Actel Corporation ]
 浏览型号5962-0421901QYC的Datasheet PDF文件第29页浏览型号5962-0421901QYC的Datasheet PDF文件第30页浏览型号5962-0421901QYC的Datasheet PDF文件第31页浏览型号5962-0421901QYC的Datasheet PDF文件第32页浏览型号5962-0421901QYC的Datasheet PDF文件第34页浏览型号5962-0421901QYC的Datasheet PDF文件第35页浏览型号5962-0421901QYC的Datasheet PDF文件第36页浏览型号5962-0421901QYC的Datasheet PDF文件第37页  
MIL-PRF-38535K  
TABLE IA. Screening procedure for hermetic classes Q, V and non-hermetic class Y microcircuits - Continued.  
MIL-STD-883, test method (TM) and conditions  
Screening Tests  
Class Q  
Class V  
Class Y  
(class level B)  
(class level S)  
(class level S)  
14. Percent defective allowable (PDA)  
5 percent PDA  
(all lots)  
5 percent PDA,  
3 percent PDA for functional 3 percent PDA for functional  
5 percent PDA,  
calculation  
17/  
parameters at 25°C  
(all lots)  
parameters at 25°C  
(all lots)  
In accordance with  
applicable device  
specification  
In accordance with  
applicable device  
specification  
In accordance with  
applicable device  
specification  
15. Final electrical tests 18/  
(see table III)  
a. Static test :  
(see group A test)  
(see group A test)  
(see group A test)  
(1) at 25°C  
(2) Maximum and Minimum  
operating temperature  
b. Dynamic or functional test : 19/  
(1) at 25°C  
(2) Maximum and Minimum  
operating temperature  
c. Switching test :  
(1) at 25°C  
(2) Maximum and Minimum  
operated temperature  
16. Seal test  
a. Fine leak  
20/  
TM 1014  
TM 2009  
TM 1014  
Not applicable  
b. Gross leak  
17. Radiographic (X-ray) and/or  
X-ray: TM 2012, Two views;  
C-SAM TM 2030  
X-ray: TM 2012, Two views;  
C-SAM TM 2030  
C-SAM test  
21/  
18. External visual inspection  
22/ 23/  
TM 2009  
TM 2009  
19. Qualification or quality conformance  
inspection/TCI test sample selection  
24/  
24/  
24/  
20. Radiation dose rate induced  
TM 1020  
TM 1020  
TM 1020  
latch-up test  
25/  
Note: The screening and QCI/TCI tables from MIL-PRF-38535 and MIL-STD-883 Test Methods 5004 and 5005 have been  
combined for consistency. A future revision of MIL-STD-883 will reflect this change as well. Manufacturers shall document in  
their QM plan the screening and QCI/TCI requirements to either MIL-PRF-38535 or MIL-STD-883.  
19  
 
 复制成功!