MIL-PRF-38535K
APPENDIX A
A.3.6.3 Identification codes. Identification codes shall be as follows:
A.3.6.3.1 Class level B die fabrication date code. Class level B microcircuits may be marked with a unique code to
identify the year and quarter in which the die fabrication was started (or completed at the manufacturer's
predesignated option). The first character of the code shall be the last digit of the year in which die fabrication started
(or completed at the manufacturer's predesignated option). The second character of the code shall be a letter (A, B,
C, or D) respectively designating the first quarter (weeks 1 - 13), the second quarter (weeks 14 - 26), third quarter
(weeks 27 - 39), or fourth quarter (weeks 40 - 52 or 53) of the calendar year of die fabrication.
A.3.6.3.2 Inspection lot identification code for class levels S and B. Microcircuits shall be marked with a unique
code to identify the inspection lot (see A.3.1.3.7 and A.3.1.3.8) and identify the first or the last week of the period (6
weeks maximum) during which devices in that inspection lot were sealed. At the option of the manufacturer, the
actual week of seal may be used. The first two numbers in the code shall be the last two digits of the number of the
year, and the third and fourth numbers shall be two digits indicating the calendar week of the year. When the number
of the week is a single digit, it shall be preceded by a zero. Reading from left to right or from top to bottom, the code
number shall designate the year and week, in that order. When two or more different inspection lots (or class level S
sublots), each having the same part number, are to be marked with the same identification code, a unique suffix letter
representing each additional inspection lot (or class level S sublot) shall appear immediately following the
identification code except the unique suffix letter may be omitted when an alternate lot identifier is used which
maintains the unique traceability required. Once assigned, the inspection lot identification code shall not be changed.
NOTE: These die fabrication date codes may be combined with the inspection lot identification code as shown:
FAB YR
6
1986
FAB QTR
B
2nd qtr
ASSY YR
87
1987
ASSY WK
Unique suffix
A
10
10
First lot
A.3.6.4 Manufacturer's identification. Microcircuits shall be marked with the name or trademark of the
manufacturer. The identification of the equipment manufacturer may appear on the microcircuit only if the equipment
manufacturer is also the microcircuit manufacturer.
A.3.6.5 Manufacturer's designating symbol. The microcircuit manufacturer's designating symbol or CAGE code
may also be marked on each device in addition to the manufacturer's identification. If the microcircuit manufacturer's
designating symbol or CAGE code number is marked, it shall be as assigned by the Defense Logistics Information
Service (DLIS). The designating symbol shall be used only by the manufacturer to whom it has been assigned and
only on those devices manufactured at that manufacturer's plant. In the case of small microcircuits, the
manufacturer's designating symbol may be abbreviated by omitting the first "C" in the series of letters.
A.3.6.6 Country of origin. The identifier of the country in which assembly is performed shall be marked on all
devices supplied under this appendix. If abbreviations are used, a cross reference should be published in the
manufacturer’s data books or catalogs.
A.3.6.7 Compliance indicator/certification mark. The compliance indicator "C" shall be marked on all devices built
in compliance to this appendix. The “D” certification mark shall be used for diminishing manufacturing sources (DMS)
product using the alternate die/fab requirements (see A.3.2.2) in lieu of the “C” certification mark for product built to
this appendix. The compliance indicator "C" shall be replaced with a "Q" or "QML" certification mark or the "Q" or
"QML" certification mark added when product is built to a QML process (see A.3.1). The "J" or "JAN" certification
mark may not be used on devices built in compliance to this appendix.
A.3.6.8 Serialization. Prior to the first recorded electrical measurement in screening each class level S
microcircuit, and when specified, each class level B microcircuit shall be marked with a unique serial number
assigned consecutively within the inspection lot. This serial number allows traceability of test results down to the
level of the individual microcircuit within that inspection lot. For class level S, inspection lot records shall be
maintained to provide traceability from the serial number to the specific wafer lot from which the devices originated.
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ACTEL [ Actel Corporation ]
