MIL-PRF-38535K
APPENDIX A
A.3.4.1.4 Qualification to ESD classes. Initial qualification to an ESD class, or requalification after redesign, shall
consist of qualification to the appropriate quality and reliability level (class level S or B) plus ESD classification in
accordance with test method 3015 of MIL-STD-883. The test procedure defined within JESD22-A114 (see A.4.4.2.8)
may optionally be used provided the manufacturer is able to demonstrate correlation with test method 3015 of
MIL-STD-883, but the classification levels defined below shall be reported.
ESD classification levels are defined as follows:
Prior
destination
category
Optional
individual
part marking
Optional
package
marking
ESD class
designator
Electrostatic
voltage
0
---
---
---
---
∆0
∆A
∆B
∆C
∆0
∆A
∆B
∆C
< 250 V
1A
1B
1C
250 V – 499 V
500 V – 999 V
1,000 V – 1,999 V
1 (see note)
2
3 (see note)
3A
3B
A
B
---
---
---
∆ (see note)
∆∆
∆∆∆ (see note)
∆∆∆A
∆∆∆B
∆ (see note)
∆∆
∆∆∆ (see note)
∆∆∆A
∆∆∆B
0 V – 1,999 V
2,000 V – 3,999 V
≥ 4,000 V
4,000 V – 7,999 V
≥ 8,000 V
NOTE: ESD class designator 1 has been replaced with designators 0, 1A, 1B, and 1C as of 15 March 2006.
The manufacturer shall test and may mark the tested level obtained under “Optional individual part marking” and
the optional individual part marking may be used as the pin one identifier. Also, ESD class designator 3 has
been replaced by 3A and 3B ESD class designators. ESD class designation 3 may continue to be used for
devices tested before 15 March 2006. After 15 March 2006, for newly developed products, the 3A and 3B
designators shall be used. Prior designation category devices previously classed by test as category A may be
marked as class 1 (∆) and devices previously classified as category B may be marked as class 2 (∆∆).
a. Devices existing prior to 30 September 1989 that were not ESD classification tested shall be marked as class 1
until classified. Devices previously classified by test as category A shall be marked class 1. Devices
previously classified by test as category B shall be marked as class 2. If it can be shown that test results
obtained using TM 3015.3 of MIL-STD-883 correlate with results using TM 3015.6 of MIL-STD-883 (or later
versions) or JESD22-A114 (see A.4.4.2.8) and give correct ESD classification, retesting of previously tested
devices is not required except where redesign has occurred.
b. Beginning no later than 31 December 1988 but prior to 15 March 2006, all newly designed or redesigned
device types shall have been classified as ESD class 1, 2, or 3 in accordance with TM 3015 of MIL-STD-883 or
JESD22-A114 (see A.4.4.2.8). After 15 March, 2006 the device types shall be classified as above.
c. After 30 September 1989, in order to be compliant with this appendix or 1.2.1 of MIL-STD-883, all other device
types for use in new system or equipment designs or system or equipment redesigns shall have completed
classification in accordance with test method 3015 of MIL-STD-883 or JESD22-A114 (see A.4.4.2.8). All
devices of existing design (e.g., not subject to A.3.4.1.4b above) shall be marked class 1 except when known
by test to be, in fact, class 2 or better, in which case they shall be correctly identified for ESD.
d. Although little variation due to case outline is expected, if a device type is available in more than one package
type or case outline, ESD testing and classification shall be applied to at least that one package type shown by
experience to be worst case for ESD.
e. ESD testing classification results (or class one marking assigned without test) shall be submitted to DLA Land
and Maritime-VA for all SMD devices built in compliance to this appendix. ESD testing classification results for
non-SMD devices built in compliance to this appendix shall be retained by the manufacturer and made
available to the acquiring or preparing activity upon request.
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ACTEL [ Actel Corporation ]
