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5962-0421901QUA 参数 Datasheet PDF下载

5962-0421901QUA图片预览
型号: 5962-0421901QUA
PDF下载: 下载PDF文件 查看货源
内容描述: [Field Programmable Gate Array, 250000 Gates, CMOS, CPGA624, CERAMIC, CGA-624]
分类和应用: 可编程逻辑
文件页数/大小: 217 页 / 1554 K
品牌: ACTEL [ Actel Corporation ]
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MIL-PRF-38535K  
APPENDIX A  
A.2.2.2 Other Government documents, drawings, and publications. The following other Government documents,  
drawings, and publications form a part of this document to the extent specified herein. Unless otherwise specified,  
the issues of these documents are those cited in the solicitation or contract.  
DSCC-VQC-42  
- Baseline Sheet for Microcircuits Materials and Construction.  
(Copies of DSCC-VQC-42 are available from DLA Land and Maritime (ATTN: DLA Land and Maritime-VQC),  
P.O. Box 3990, Columbus, OH 43218-3990.)  
QML-38535  
- Qualified Manufacturers List of Products Qualified Under Performance Specification  
MIL-PRF-38535 Integrated Circuits (Microcircuits) Manufacturing, General  
Specification For.  
(Copies of these documents are available online at http://quicksearch.dla.mil/ or from the Standardization  
Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)  
A.2.3 Non-Government publications. The following documents form a part of this document to the extent specified  
herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract.  
ASTM INTERNATIONAL (ASTM)  
ASTM F15  
ASTM F30  
ASTM B170  
ASTM B487  
- Standard Specification for Iron-Nickel-Cobalt Sealing Alloy.  
- Standard Specification for Iron-Nickel Sealing Alloy.  
- Standard Specification for Oxygen-Free Electrolytic Copper-Refinery Shapes.  
- Standard Test Method for Measurement of Metal and Oxide Coating Thickness by  
Microscopical Examination of a Cross Section.  
ASTM B567  
ASTM B568  
- Standard Test Method for Measurement of Coating Thickness by the Beta Backscatter  
Method.  
- Standard Test Method for Measurement of Coating Thickness by X-Ray Spectrometry.  
(Copies of these documents are available online at http://www.astm.org/ or from ASTM International, 100 Barr  
Harbor Drive, P.O. Box C700, West Conshohocken, PA 19428-2959.)  
AMERICAN NATIONAL STANDARDS INSTITUTE (ANSI)  
ANSI/NCSL Z540.3 - Calibration Laboratories and Measuring and Test Equipment - General  
Requirements.  
(Copies of these documents are available online at http://www.ansi.org/ or from American National Standards  
Institute, Incorporated, 25 West 43rd Street, 4th Fl. New York, NY 10036.)  
JEDEC – SOLID STATE TECHNOLOGY ASSOCIATION (JEDEC)  
JESD471  
JESD541  
JESD22-A114  
JESD31  
JESD625  
JEP114.01  
- Symbol & Label for Electrostatic Sensitive Devices.  
- Packaging Material Standards for ESD Sensitive Items.  
- Electrostatic Discharge (ESD) Sensitivity Testing Human Body Model (HBM).  
- General Requirements for Distributors of Commercial and Military Semiconductors.  
- Requirements for Handling Electrostatic-Discharge-Sensitive (ESDS) Devices.  
- Guidelines for Particle Impact Noise Detection (PIND) Testing, Operator Training and  
Certification.  
(Copies of these documents are available online at http://www.jedec.org or from JEDEC – Solid State Technology  
Association, 3103 North 10th Street, Suite 240–S, Arlington, VA 22201-2107.)  
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