MIL-PRF-38535K
TABLE III. Group A (electrical tests) . 1/
MIL-STD-883 test method and conditions
Minimum sample size quantity (accept no.) 2/ 3/ 4/ 5/
Subgroups
Tests
Class Q
(class level B)
Class V 6/
(class level S)
Class Y 6/
(class level S)
1
2
Static tests at +25°C
116(0) or
100 percent/ 0 sample
116(0) or
100 percent/ 0 sample
116(0) or
100 percent/ 0 sample
Static tests at maximum rated
operating temperature
3
Static tests at minimum rated
operating temperature
Dynamic tests at +25°C
4
5
6
116(0) or
100 percent/ 0 sample
116(0) or
100 percent/ 0 sample
116(0) or
100 percent/ 0 sample
Dynamic tests at maximum rated
operating temperature
Dynamic tests at minimum rated
operating temperature
7
Functional tests at +25°C
116(0) or
100 percent/ 0 sample
116(0) or
100 percent/ 0 sample
116(0) or
100 percent/ 0 sample
Functional tests at maximum rated
operating temperature
8A
Functional tests at minimum rated
operating temperature
8B
9
Switching tests at +25°C
116(0) or
100 percent/ 0 sample
116(0) or
100 percent/ 0 sample
116(0) or
100 percent/ 0 sample
Switching tests at maximum rated
operating temperature
10
11
Switching tests at minimum rated
operating temperature
1/ The specific parameters to be included for tests in each subgroup shall be as specified in the applicable acquisition document.
Where no parameters have been identified in a particular subgroup or test within a subgroup, no group A testing is required for
that subgroup or test to satisfy group A requirements.
2/ At the manufacturer's option, the applicable tests required for group A testing (see 1/ herein) may be conducted individually or
combined into sets of tests, subgroups (as defined in table III), or sets of subgroups. However, the manufacturer shall pre-
designate these groupings prior to group A testing. Unless otherwise specified, the individual tests, subgroups, or sets of
tests/subgroups may be performed in any sequence.
3/ The sample plan (quantity and accept number) for each test, subgroup, or set of tests/subgroups as pre-designated in 2/ herein,
shall be 116/0.
4/ A greater sample size may be used at the manufacturer's option; however, the accept number shall remain at zero. When the
(sub)lot size is less than the required sample size, each and every device in the (sub)lot shall be inspected and all failed
devices removed from the (sub)lot for final acceptance of that test, subgroup, or set of tests/subgroups, as applicable. For
those lots having a quantity of less than 116 devices, the test shall be imposed on a 100 percent basis with zero failure.
5/ If any device in the sample fails any parameter in the test, subgroup, or set of tests/subgroups being sampled, each and every
additional device in the (sub)lot represented by the sample shall be tested on the same test set-up for all parameters in that
test, subgroup, or set of tests/subgroups for which the sample was selected, and all failed devices shall be removed from the
(sub)lot for final acceptance of that test, subgroup, or set of tests/subgroups, as applicable. For device class V or class Y (class
level S), if the testing results in a percent defective allowable (PDA) greater than 5 percent, the (sub)lot shall be rejected, except
that for (sub)lots previously unscreened to the tests that caused failure of this percent defective, the (sub)lot may be accepted
by resubmission and passing the failed individual tests, subgroups, or set of tests/subgroups, as applicable, using a 116/0
sample.
6/ For class V and class Y, group A electrical tests additional requirements see paragraph B.4.3 appendix B of MIL-PRF-38535.
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ACTEL [ Actel Corporation ]
