MIL-PRF-38535K
TABLE IV. Group C life tests .
MIL-STD-883 test method and conditions
Minimum sample size quantity (accept no.)
Tests
Subgroup
Class Q
(class level B)
1/
Class V
(class level S)
1/ 2/
Class Y
(class level S)
1/ 2/
Subgroup 1
a. Steady-state life test a. TM 1005 45(0)
1000 hours at 125°C
a. TM 1005 45(0)
a. TM 1005 45(0)
1000 hours at 125°C
1000 hours at 125°C
b. End-point electrical
parameters
b. As specified in the
applicable device
b. As specified in the
applicable device
b. As specified in the
applicable device
procurement specification
procurement specification
procurement specification
1/ Life test may be performed on a quantity (accept) criteria of 22(0) for 2000 hours at 125°C or equivalent per TM 1005 to attain
44,000 device hours. For lots greater than 200, actual devices shall be used. For lots less than or equal to 200, the number
of actual devices shall be the greater of 5 devices or 10 percent of the lot, and the SEC shall supplement actual devices to
result in a sample of 22 unless acceptable group C data from the same lot of SEC is available for the previous 3 months. The
SEC shall have been produced under equivalent conditions as the production lot and as close in time as feasible, but not to
exceed a 3-months period.
2/ Group C life tests shall be performed on the initial production lot of actual devices from each wafer lot, in accordance with
table IV herein. Group C life tests are not required to be performed on subsequent production lots when all the following
conditions are met:
(a) Subsequent production lots utilize die from the same wafer lot as the initial production lot.
(b) Wafers or die remaining from the initial production lot are to be stored in dry nitrogen or equivalent controlled storage,
and in covered containers.
(c) No major changes to the assembly processes have occurred since the group C test was performed on the wafer lot.
Note: For ASICs, a sample size of 5 actual devices may be used with the balance being made up of the SEC.
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ACTEL [ Actel Corporation ]
