欢迎访问ic37.com |
会员登录 免费注册
发布采购

5962-0421901QUA 参数 Datasheet PDF下载

5962-0421901QUA图片预览
型号: 5962-0421901QUA
PDF下载: 下载PDF文件 查看货源
内容描述: [Field Programmable Gate Array, 250000 Gates, CMOS, CPGA624, CERAMIC, CGA-624]
分类和应用: 可编程逻辑
文件页数/大小: 217 页 / 1554 K
品牌: ACTEL [ Actel Corporation ]
 浏览型号5962-0421901QUA的Datasheet PDF文件第163页浏览型号5962-0421901QUA的Datasheet PDF文件第164页浏览型号5962-0421901QUA的Datasheet PDF文件第165页浏览型号5962-0421901QUA的Datasheet PDF文件第166页浏览型号5962-0421901QUA的Datasheet PDF文件第168页浏览型号5962-0421901QUA的Datasheet PDF文件第169页浏览型号5962-0421901QUA的Datasheet PDF文件第170页浏览型号5962-0421901QUA的Datasheet PDF文件第171页  
MIL-PRF-38535K  
APPENDIX H  
H.3.1.9 Overview of QML Approval Process. The process for achieving QML approval is outlined below in six basic stages  
and is further described in detail in the subsequent sections. The stages are listed in the normal sequence to be accomplished;  
however, several stages may occur concurrently.  
a) Design, wafer fabrication, assembly, and test certification;  
1) Design methodologies:  
i) Reliability and radiation hardness assurance (RHA) design rules.  
2) Wafer fabrication/foundry processes:  
i) SPC controls  
ii) Metallization controls  
iii) Reliability monitors  
3) Assembly processes  
4) Screening and Test Methodologies  
5) Audit/approval  
b) Physics-of-failure/TCV reliability assessment;  
1) Plan approval  
i) Electromigration (EM)  
ii) Time dependent dielectric breakdown (TDDB)  
iii) Hot carrier injection (HCI)  
iv) Threshold voltage instability, including Negative Bias Temperature Instability (NBTI) for 130 nm and  
smaller CMOS technologies.  
v) Metallization stability over life.  
vi) Others as applicable  
2) Report approval  
c) Process technology validation/SEC qualification;  
1) Plan approval  
i) Screening flow  
ii) Process performance characterizations  
iii) Process qualification tests  
iv) For class level B products, life test on a minimum of 1 wafer lot for 1000 hrs minimum at 125°C ambient,  
or equivalent.  
v) For class level S products, long term life test shall meet the requirements of paragraph B.3.4, appendix B,  
or shall meet long term life test on a minimum of 1 wafer lot for 4,000 hours minimum at 125°C ambient, or  
equivalent.  
2) Report approval  
d) Product qualification (From existing qualified process technology)  
1) Plan approval  
i) Screening flow  
ii) Product performance characterizations  
iii) Product qualification tests  
iv) 1,000 hour life test or equivalent  
2) Report approval  
e) Standard Microcircuit Drawing (SMD)  
1) Draft development  
2) User coordination  
3) SMD release  
f) QML listing of approved parts.  
153  
 
 
 复制成功!