PULSE GEN.
= 50 Ω
Z
O
t = t = 5 ns
f
r
INPUT V
MONITORING NODE
E
3.3V or 5V
V
3.0 V
1.5 V
1
2
3
4
8
7
6
5
CC
INPUT
V
7.5 mA
E
0.1 µF
BYPASS
R
L
I
F
t
t
ELH
EHL
OUTPUT V
MONITORING
NODE
O
OUTPUT
V
O
1.5 V
*C
L
GND
*C IS APPROXIMATELY 15 pF WHICH INCLUDES
L
PROBE AND STRAY WIRING CAPACITANCE.
Figure 9. Test circuit for tEHL and tELH
.
I
F
SINGLE CHANNEL
DUAL CHANNEL
B
A
I
F
V
V
3.3V or 5V
OUTPUT V
8
7
6
5
3.3V or 5V
OUTPUT V
MONITORING
NODE
1
2
3
4
8
7
6
5
1
2
3
4
CC
CC
R
B
A
L
O
0.1 µF
BYPASS
R
L
V
FF
O
V
0.1 µF
BYPASS
FF
MONITORING
NODE
GND
GND
V
V
CM
CM
+
–
+
–
PULSE
GENERATOR
PULSE
GENERATOR
Z
= 50 Ω
Z = 50 Ω
O
O
V
(PEAK)
(MIN.)
CM
V
CM
0 V
5 V
SWITCH AT A: I = 0 mA
F
CM
H
V
O
V
O
SWITCH AT B: I = 7.5 mA
F
V
(MAX.)
O
V
O
0.5 V
CM
L
Figure 10. Test circuit for common mode transient immunity and typical waveforms.
GND BUS (BACK)
V
BUS (FRONT)
NC
CC
ENABLE
OUTPUT
0.1µF
NC
10 mm MAX.
(SEE NOTE 5)
SINGLE CHANNEL
DEVICE ILLUSTRATED.
Figure 11. Recommended printed circuit board layout.
17
ETC [ ETC ]
