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XC5202-5VQ100I 参数 Datasheet PDF下载

XC5202-5VQ100I图片预览
型号: XC5202-5VQ100I
PDF下载: 下载PDF文件 查看货源
内容描述: 现场可编程门阵列(FPGA)的\n [Field Programmable Gate Array (FPGA) ]
分类和应用: 现场可编程门阵列可编程逻辑时钟
文件页数/大小: 73 页 / 583 K
品牌: ETC [ ETC ]
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R
XC5200 Series Field Programmable Gate Arrays  
Typically, a 0.1 µF capacitor connected near the Vcc and  
Ground pins of the package will provide adequate decou-  
pling.  
Optional  
To User  
Logic  
IBUF  
BSCAN  
RESET  
Output buffers capable of driving/sinking the specified 8 mA  
loads under specified worst-case conditions may be capa-  
ble of driving/sinking up to 10 times as much current under  
best case conditions.  
UPDATE  
SHIFT  
TDO  
TDI  
Noise can be reduced by minimizing external load capaci-  
tance and reducing simultaneous output transitions in the  
same direction. It may also be beneficial to locate heavily  
loaded output buffers near the Ground pads. The I/O Block  
output buffers have a slew-rate limited mode (default)  
which should be used where output rise and fall times are  
not speed-critical.  
TMS  
TCK  
DRCK  
IDLE  
To User  
Logic  
TDO1  
TDO2  
SEL1  
From  
User Logic  
SEL2  
X9000  
Figure 20: Boundary Scan Schematic Example  
Even if the boundary scan symbol is used in a schematic,  
the input pins TMS, TCK, and TDI can still be used as  
inputs to be routed to internal logic. Care must be taken not  
to force the chip into an undesired boundary scan state by  
inadvertently applying boundary scan input patterns to  
these pins. The simplest way to prevent this is to keep  
TMS High, and then apply whatever signal is desired to TDI  
and TCK.  
GND  
Ground and  
Vcc Ring for  
I/O Drivers  
Avoiding Inadvertent Boundary Scan  
Vcc  
Vcc  
If TMS or TCK is used as user I/O, care must be taken to  
ensure that at least one of these pins is held constant dur-  
ing configuration. In some applications, a situation may  
occur where TMS or TCK is driven during configuration.  
This may cause the device to go into boundary scan mode  
and disrupt the configuration process.  
Logic  
Power Grid  
7
GND  
X5422  
To prevent activation of boundary scan during configura-  
tion, do either of the following:  
Figure 21: XC5200-Series Power Distribution  
TMS: Tie High to put the Test Access Port controller  
in a benign RESET state  
TCK: Tie High or Low—do not toggle this clock input.  
Pin Descriptions  
There are three types of pins in the XC5200-Series  
devices:  
For more information regarding boundary scan, refer to the  
Xilinx Application Note XAPP 017, “Boundary Scan in  
XC4000 and XC5200 Devices.“  
Permanently dedicated pins  
User I/O pins that can have special functions  
Unrestricted user-programmable I/O pins.  
Power Distribution  
Before and during configuration, all outputs not used for the  
configuration process are 3-stated and pulled high with a  
20 k- 100 kpull-up resistor.  
Power for the FPGA is distributed through a grid to achieve  
high noise immunity and isolation between logic and I/O.  
Inside the FPGA, a dedicated Vcc and Ground ring sur-  
rounding the logic array provides power to the I/O drivers,  
as shown in Figure 21. An independent matrix of Vcc and  
Ground lines supplies the interior logic of the device.  
After configuration, if an IOB is unused it is configured as  
an input with a 20 k- 100 kpull-up resistor.  
Device pins for XC5200-Series devices are described in  
Table 9. Pin functions during configuration for each of the  
seven configuration modes are summarized in “Pin Func-  
This power distribution grid provides a stable supply and  
ground for all internal logic, providing the external package  
power pins are all connected and appropriately decoupled.  
November 5, 1998 (Version 5.2)  
7-101  
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