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LE7920-1JC 参数 Datasheet PDF下载

LE7920-1JC图片预览
型号: LE7920-1JC
PDF下载: 下载PDF文件 查看货源
内容描述: [SLIC, 2-4 Conversion, PQCC32, PLASTIC, MS-016, LCC-32]
分类和应用: 电池电信电信集成电路
文件页数/大小: 19 页 / 630 K
品牌: ZARLINK [ ZARLINK SEMICONDUCTOR INC ]
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Le7920  
Data Sheet  
ABSOLUTE MAXIMUM RATINGS  
Storage temperature......................... –55°C to +150°C  
V
with respect to AGND/DGND ..... –0.4 V to +7.0 V  
CC  
V
with respect to AGND/DGND:  
BAT  
Continuous..................................... +0.4 V to –70 V  
10 ms ............................................. +0.4 V to –75 V  
BGND with respect to AGND/DGND........ +3 V to –3 V  
A(TIP) or B(RING) to BGND:  
Continuous ........................................ V  
to +1 V  
BAT  
10 ms (f = 0.1 Hz) ............................. –70 V to +5 V  
1 µs (f = 0.1 Hz) ................................ –80 V to +8 V  
250 ns (f = 0.1 Hz) .......................... –90 V to +12 V  
Current from A(TIP) or B(RING).....................±150 mA  
RINGOUT/RYOUT1,2,3 current.........................50 mA  
RINGOUT/RYOUT1,2,3 voltage ........... BGND to +7 V  
RINGOUT/RYOUT1,2,3 transient....... BGND to +10 V  
DA and DB inputs  
Voltage on ring-trip inputs.....................V  
to 0 V  
BAT  
Current into ring-trip inputs .........................±10 mA  
C2–C1 and D3–D1  
Input voltage .........................–0.4 V to V + 0.4 V  
CC  
Maximum power dissipation, continuous,  
T = 70°C, No heat sink (See note)  
A
In 32-pin PLCC package................................1.7 W  
Thermal Data:................................................................θ  
JA  
In 32-pin PLCC package.......................43°C/W typ  
ESD immunity/pin (HBM) ..................................1500 V  
Note: Thermal limiting circuitry on chip will shut down the circuit at a junction temperature of about 165°C. Continuous operation  
above 145°C junction temperature may degrade device reliability.  
Stresses above those listed under "Absolute Maximum Ratings" can cause permanent device failure. Functionality at or above  
these limits is not implied. Exposure to absolute maximum ratings for extended periods may affect device reliability.  
6
Zarlink Semiconductor Inc.  
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