Le77D11
Data Sheet
TEST CIRCUIT
Per Channel
V
CC
100 nF
16 V
+
I
LOOP
TIP
i
R
L
VOUT
i
B
i
(RING)
100 kΩ
VHP
i
280 kΩ
FSET*
VSW*
+
0.1Ω
4.7 µF
–
V
IN
VIN
i
V
REF
VCC*
A
i
(TIP)
LPFi
RING
i
V
SW
CFILT
i
U1
Le77D11
RDC
i
IMT
i
ILS
i
SD
i
*VREF
*CHCLK
C1
i
VREG
i
CHS
i
AGND*
1 nF
BGND
i
C2
i
C3
i
NPRFILT
i
Fi
V
REF
1.5 µF
20 kΩ
4.7 kΩ
1 µF
85.3 kHz
STATE
SELECTION
V
DC
0.1 µF
Place close
to VSW pin
BAV99TA
27 nF
FZT955
ESC2
150 µH
2.0 µF
300 V
C
VREGi
L
SWi
47 µH
100 nF
180
Ω
C
SW
220 µF –
2.0 µF
300 V
100 nF
16 V
4148-SOT
1
2
V
SW
*
To base of QSW
on
other channel
Note:
* denotes pins that are common to both channels.
i = per channel component.
18
Zarlink Semiconductor Inc.