Qualification Data
Part
Test
Sample
Hours/Cycles
Fails
Status
XCF04S
XCF04S
77
1000
0
Pass
HTOL @140°C
Temp Cycle, Condition C
-65°C to 150°C
76
77
77
1000
1000
96
0
0
0
Pass
Pass
Pass
XCF04S
XCF04S
HTS, 150°C
Temperature/Humidity
Bias Test - Hast 130°C/85%RH
XCF04S
XCF04S
ESD - HBM JESD22-A-114
Latchup – EIA/JESD78
12
6
2000 volts
200 mA
0
0
Pass
Pass
Table 3: Reliability Qualification Data
Recommendation
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Revision History
The following table shows the revision history for this document.
Date
Version
Revision
8/9/04
1.0
Initial Xilinx release.
© 2004 Xilinx, Inc. All rights reserved. All Xilinx trademarks, registered trademarks, patents, and disclaimers are as listed at http://www.xilinx.com/legal.htm.
All other trademarks and registered trademarks are the property of their respective owners. All specifications are subject to change without notice.
PCN2004-18 (v1.0) August 9, 2004
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