Production Data
WM8580
Test Conditions
AVDD, PVDD, VREFP = 5V, DVDD = 3.3V, AGND, VREFN = 0V, PGND, DGND = 0V, TA = +25oC, 1kHz Signal, fs = 48kHz, 24-
Bit Data, Slave Mode, MCLK, ADCMCLK = 256fs, 1Vrms Input Signal Level unless otherwise stated.
PARAMETER
SYMBOL
TEST CONDITIONS
MIN
TYP
MAX
UNIT
Analogue Reference Levels
Reference voltage
VVMID
RVMID
VREFP/2 –
50mV
VREFP/2
14
VREFP/2 +
50mV
V
Potential divider resistance
VREFP to VMID and
VMID to VREFN
kΩ
VMIDSEL = 1
VREFP to VMID and
VMID to VREFN
44
50
kΩ
VMIDSEL = 0
S/PDIF Transceiver Performance
Jitter on recovered clock
S/PDIF Input Levels CMOS MODE
Input LOW level
ps
VIL
VIH
0.3 X DVDD
36
V
V
Input HIGH level
0.7 X DVDD
Input capacitance
1.25
pF
Input Frequency
MHz
S/PDIF Input Levels Comparator MODE
Input capacitance
Input resistance
Input frequency
Input Amplitude
PLL
10
23
pF
kΩ
25
MHz
mV
200
0.5 X DVDD
Period Jitter
XTAL
80
ps(rms)
Input XTI LOW level
Input XTI HIGH level
Input XTI capacitance
Input XTI leakage
VXIL
0
557
mV
mV
pF
VXIH
CXJ
853
3.32
28.92
86
4.491
38.96
278
IXleak
VXOL
VXOH
mA
mV
V
Output XTO LOW
Output XTO HIGH
Supply Current
15pF load capacitors
15pF load capacitors
1.458
1.942
Analogue supply current
Analogue supply current
Digital supply current
Power Down
AVDD, VREFP = 5V
AVDD, VREFP = 3.3V
DVDD = 3.3V
45
30
mA
mA
mA
µA
25
500
Notes:
1. Ratio of output level with 1kHz full scale input, to the output level with all zeros into the digital input, measured ‘A’
weighted.
2. All performance measurements done with 20kHz low pass filter, and where noted an A-weight filter. Failure to use
such a filter will result in higher THD+N and lower SNR and Dynamic Range readings than are found in the Electrical
Characteristics. The low pass filter removes out of band noise; although it is not audible, it may affect dynamic
specification values.
3. VMID decoupled with 10uF and 0.1uF capacitors (smaller values may result in reduced performance).
4. PSSR measured with VMID set to high impedance
PD Rev 4.3 August 2007
11
w