WM8200
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ABSOLUTE MAXIMUM RATINGS
Absolute Maximum Ratings are stress ratings only. Permanent damage to the device may be caused by continuously operating at
or beyond these limits. Device functional operating limits and guaranteed performance specifications are given under Electrical
Characteristics at the test conditions specified.
ESD Sensitive Device. This device is manufactured on a CMOS process. It is therefore generically susceptible
to damage from excessive static voltages. Proper ESD precautions must be taken during handling and storage
of this device.
CONDITION
MIN
-0.3V
MAX
+3.63V
Digital supply voltage, DVDD to DGND
Analog supply voltage, AVDD to AGND
Maximum voltage difference between AGND and DGND
Voltage range digital input (SCLK, SDIN, CSB, CLAMP)
Voltage range analog inputs
-0.3V
+3.63V
-0.3V
+0.3V
DGND - 0.3V
AGND - 0.3V
AGND - 0.3V
-40°C
DVDD + 0.3V
AVDD + 0.3V
AVDD + 0.3V
+150°C
Voltage range CLK, MODE inputs
Operating junction temperature range, TJ
Storage temperature
-65°C
+150°C
Package Body Temperature (soldering 10 seconds)
Package Body Temperature (soldering 2 minutes)
+240°C
+183°C
RECOMMENDED OPERATING CONDITIONS
PARAMETER
SYMBOL
DVDD
TEST CONDITIONS
MIN
3.0
NOM
3.3
3.3
0
MAX
3.6
UNIT
Digital supply range
Analog supply range
Ground
V
V
AVDD
3.0
3.6
DGND, AGND
fCLK
V
Clock frequency
5
40
55
85
MHz
%
Clock duty cycle
45
-40
50
Operating Free Air Temperature
TA
°C
PP Rev 1.22 March 2002
4
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WOLFSON [ WOLFSON MICROELECTRONICS PLC ]
