Advanced Information
WM8181
TEST CHARACTERISTICS
AVDD = DVDD = 2.97 to 3.63V and 4.5 to 5.5V, AGND1 = AGND2 = DGND = 0V, TA = 0 to 70°C, MCLK = 24MHz
unless otherwise stated.
PARAMETER
SYMBOL
TEST
MIN
TYP
MAX
UNIT
CONDITIONS
DIGITAL SPECIFICATION
Digital Inputs
High level input voltage
Low level input voltage
High level input current
Low level input current
Input capacitance
VIH
VIL
0.8 DVDD
V
0.2 DVDD
V
<1
<1
5
µA
µA
pF
Digital Outputs
High level output voltage
Low level output voltage
High impedance output current
I
OH = 1mA
DVDD - 0.5
V
V
I
OL = -1mA
0.5
<1
µA
OVERALL SYSTEM SPECIFICATION
Supply Currents
Total analogue supply current –
active
AVDD = DVDD = 5V
AVDD = DVDD = 3.3V
AVDD = DVDD = 5V
AVDD = DVDD = 3.3V
AVDD = DVDD = 5V
AVDD = DVDD = 3.3V
21
19
2
mA
mA
mA
mA
µA
Total digital supply current –
active
1
Supply current – disabled
<1
<1
µA
tPER
tMCLKH tMCLKL
MCLK
VSMP
DOUT
tVSMPH
tVSMPSU
SAMPLE n
tPD
n-2 D[11]
n-2 D[10]
n-2 D[9]
Figure 1 Clock Inputs and Data Output
TEST CHARACTERISTICS
AVDD = DVDD = 2.97 to 3.63V and 4.5 to 5.5V, AGND1 = AGND2 = DGND = 0V, TA = 0 to 70°C, MCLK = 24MHz
unless otherwise stated.
PARAMETER
Maximum MCLK period
MCLK high
SYMBOL
tPER
TEST CONDITIONS
MIN
41.7
16
TYP
MAX
UNIT
ns
tMCLKH
tMCLKL
tVSMPSU
tVSMPH
tPD
ns
MCLK low
16
ns
VSMP data set-up time
VSMP data hold time
10
ns
10
ns
MCLK to DOUT
propagation delay
AVDD = DVDD = 5V
AVDD = DVDD = 3.3V
10
15
ns
MCLK to DOUT
tPD
ns
propagation delay
Note: Parameters are measured at 50% of the rising/falling edge.
AI Rev 3.0 January 2000
5
WOLFSON MICROELECTRONICS LTD
WOLFSON [ WOLFSON MICROELECTRONICS PLC ]
