Advanced Information
WM8181
ABSOLUTE MAXIMUM RATINGS
Absolute Maximum Ratings are stress ratings only. Permanent damage to the device may be caused by continuously operating at
or beyond these limits. Device functional operating limits and guaranteed performance specifications are given under Electrical
Characteristics at the test conditions specified.
ESD Sensitive Device. This device is manufactured on a CMOS process. It is therefore generically susceptible
to damage from excessive static voltages. Proper ESD precautions must be taken during handling and storage
of this device.
CONDITION
MIN
MAX
Digital supply voltage: DVDD
GND - 0.3V
GND - 0.3V
GND - 0.3V
GND - 0.3V
GND - 0.3V
GND - 0.3V
GND - 0.3V
GND + 7V
Analogue supply voltage: AVDD
GND + 7V
Digital ground: DGND. Analogue ground: AGND1, AGND2
Digital inputs: MCLK, VSMP, CLAMP
Digital outputs: DOUT
GND + 0.3V
DVDD + 0.3V
DVDD + 0.3V
AVDD + 0.3V
AVDD + 0.3V
Analogue inputs: VINM, VINP, VREFIN
Reference pins: VRT, VRB
Operating temperature range: TA
0oC
-65oC
+70oC
+150oC
+240oC
+183oC
Storage temperature
Package body temperature (soldering 10 seconds)
Package body temperature (soldering 2 minutes)
Notes: 1. GND denotes the voltage of any ground pin.
2. AGND and DGND pins are intended to be operated at the same potential. Differential voltages between these pins will
degrade performance.
RECOMMENDED OPERATING CONDITIONS
PARAMETER
SYMBOL
TEST CONDITIONS
MIN
TYP
MAX
UNIT
Operating temperature range
Analogue supply voltage (5V)
Analogue supply voltage (3.3V)
TA
0
70
5.5
°C
V
AVDD
AVDD
DVDD
4.5
5.0
3.3
3.3
2.97
2.97
3.63
AVDD
V
Digital input and output
supply voltage
V
AI Rev 3.0 January 2000
3
WOLFSON MICROELECTRONICS LTD