WM2627
Production Data
Test Conditions:
RL = 10kΩ, CL = 100pF. AVDD = DVDD = 5V ± 10%, VREF = 2.048V and AVDD = DVDD = 3V ± 10%, VREF = 1.024V over
recommended operating free-air temperature range (unless noted otherwise).
PARAMETER
SYMBOL
TEST CONDITIONS
MIN
TYP
MAX
UNIT
Reference
Reference input resistance
Reference input capacitance
Reference feedthrough
RREFIN
CREFIN
10
5
MΩ
pF
V
REF = 1VPP at 1kHz
-75
dB
+ 1.024V dc, DAC code 0
Reference input bandwidth
V
REF = 0.2VPP + 1.024V dc
DAC code 128
Slow
0.5
1
MHz
MHz
Fast
Digital Inputs
High level input current
Low level input current
Input capacitance
Notes:
IIH
IIL
CI
Input voltage = DVDD
Input voltage = 0V
±1
±1
µA
µA
pF
3
1. Integral non-linearity (INL) is the maximum deviation of the output from the line between zero and full scale (excluding the effects
of zero code and full scale errors).
2. Differential non-linearity (DNL) is the difference between the measured and ideal 1LSB amplitude change of any adjacent two
codes. A guarantee of monotonicity means the output voltage changes in the same direction (or remains constant) as a change in
digital input code.
3. Zero code error is the voltage output when the DAC input code is zero.
4. Gain error is the deviation from the ideal full scale output excluding the effects of zero code error.
5. Power supply rejection ratio is measured by varying AVDD from 4.5V to 5.5V and measuring the proportion of this signal imposed
on the zero code error and the gain error.
6. Zero code error and Gain error temperature coefficients are normalised to full scale voltage.
7. Output load regulation is the difference between the output voltage at full scale with a 10kΩ load and 2kΩ load. It is expressed as
a percentage of the full scale output voltage with a 10kΩ load.
8.
IDD is measured while continuously writing code 512 to the DAC. For VIH < DVDD - 0.7V and VIL > 0.7V supply current will increase.
9. Slew rate results are for the lower value of the rising and falling edge slew rates.
10. Settling time is the time taken for the signal to settle to within 0.1LSB of the final measured value for both rising and falling edges.
Limits are ensured by design and characterisation, but are not production tested.
11. SNR, SNRD, THD and SPFDR are measured on a synthesised sinewave at frequency fOUT generated with a sampling frequency fs.
WOLFSON MICROELECTRONICS LTD
PD Rev 1.0 April 2001
5
WOLFSON [ WOLFSON MICROELECTRONICS PLC ]
