WM2627
Production Data
ABSOLUTE MAXIMUM RATINGS
Absolute Maximum Ratings are stress ratings only. Permanent damage to the device may be caused by continuously operating at
or beyond these limits. Device functional operating limits and guaranteed performance specifications are given under Electrical
Characteristics at the test conditions specified.
ESD Sensitive Device. This device is manufactured on a CMOS process. It is therefore generically susceptible
to damage from excessive static voltages. Proper ESD precautions must be taken during handling and storage
of this device.
CONDITION
MIN
MAX
7V
Supply voltages, AVDD to AGND, DVDD to DGND
Supply voltage differences, AVDD to DVDD
Digital input voltage
-2.8V
-0.3V
-0.3V
2.8V
DVDD + 0.3V
AVDD + 0.3V
Reference input voltage
Operating temperature range, TA
WM2627C
WM2627I
0°C
70°C
85°C
-40°C
-65°C
Storage temperature
150°C
Soldering lead temperature, 1.6mm (1/16 inch) from package body for
10 seconds
260°C
RECOMMENDED OPERATING CONDITIONS
PARAMETER
SYMBOL
TEST CONDITIONS
MIN
2.7
2
TYP
MAX
UNIT
Supply voltage
AVDD, DVDD
5.5
V
V
V
V
High-level digital input voltage
Low-level digital input voltage
VIH
VIL
DVDD = 2.7V to 5.5V
DVDD = 2.7V to 5.5V
See Note
0.8
Reference voltage to
REFINAB, REFINCD
VREF
0
2
AVDD - 1.5
Load resistance
RL
CL
10
kΩ
Load capacitance
100
20
pF
Serial clock rate
fSCLK
TA
MHz
Operating free-air temperature
WM2627CDT
WM2627IDT
0
70
85
°C
°C
-40
Note: Reference voltages greater than AVDD/2 will cause output saturation for large DAC codes.
WOLFSON MICROELECTRONICS LTD
PD Rev 1.0 April 2001
3
WOLFSON [ WOLFSON MICROELECTRONICS PLC ]
