Production Data
WM2625
ELECTRICAL CHARACTERISTICS
Test Conditions:
RL = 10kΩ, CL = 100pF. VDD = 5V ±10%, VREF = 2.048V and VDD = 3V ±10%, VREF = 1.024V over recommended operating free-
air temperature range (unless noted otherwise).
PARAMETER
SYMBOL
TEST CONDITIONS
MIN
TYP
MAX
UNIT
Static DAC Specifications
Resolution
8
bits
LSB
Integral non-linearity
INL
DNL
See Note 1
See Note 2
See Note 3
See Note 4
See Note 5
See Note 6
See Note 6
±0.3
±0.5
±0.2
±12
Differential non-linearity
Zero code error
±0.07
LSB
ZCE
mV
Gain error
GE
±0.5
% FSR
mV/V
ppm/°C
ppm/°C
D.C. power supply rejection ratio
Zero code error temperature coefficient
Gain error temperature coefficient
DAC Output Specifications
Output voltage range
Output load regulation
D.C. PSRR
-65
10
10
0
VDD - 0.4
0.29
V
2kΩ to 10kΩ load
See Note 7
% FS
Power Supplies
No load, DAC value = 128,
all digital inputs 0V or VDD
Slow Mode
Active supply current
IDD
0.8
1.8
1
1
2.3
3
mA
mA
µA
Fast Mode
See Note 8
Power down supply current
Dynamic DAC Specifications
Slew rate
SR
ts
DAC output 10%-90%
Slow
Fast
0.5
3
V/µs
V/µs
See Note 9
DAC output 10%-90%
Slow
Full-scale settling time
Glitch energy
3
1
10
3
µs
µs
Fast
See Note 10
DIN = 0 to 1, fCLK = 100kHz,
NCS = VDD
5
nV-s
Signal to noise ratio
SNR
SINAD
THD
52
48
54
49
dB
dB
dB
dB
fs = 102kSPS,
Signal to noise and distortion ratio
Total harmonic distortion
Spurious free dynamic range
Reference
f
OUT = 1kHz,
See Note 11
-50
50
-48
SFDR
48
Reference input resistance
Reference input capacitance
Reference feedthrough
RREFIN
CREFIN
10
5
MΩ
pF
V
REF = 1VPP at 1kHz
-80
dB
+ 1.024V dc, DAC code 0
Reference input bandwidth
V
REF = 0.2VPP + 1.024V dc
Slow
Fast
0.525
1.3
MHz
MHz
Digital Inputs
High level input current
Low level input current
Input capacitance
IIH
IIL
CI
Input voltage = VDD
Input voltage = 0V
-1
-1
1
1
µA
µA
pF
8
WOLFSON MICROELECTRONICS LTD
PD Rev 1.0 April 2001
3
WOLFSON [ WOLFSON MICROELECTRONICS PLC ]
