Production Data
WM2618
ELECTRICAL CHARACTERISTICS
Test Conditions:
RL = 10kΩ, CL = 100pF. VDD = 5V ± 10%, VREF = 2.048V and VDD = 3V ± 10%, VREF = 1.024V over recommended operating
free-air temperature range (unless noted otherwise)
PARAMETER
SYMBOL
TEST CONDITIONS
MIN
TYP
MAX
UNIT
Static DAC Specifications
Resolution
12
bits
LSB
Integral non-linearity
INL
DNL
See Note 1
See Note 2
See Note 3
See Note 4
See Note 5
See Note 6
See Note 6
±1.9
±0.5
3
±4
±1
Differential non-linearity
Zero code error
LSB
ZCE
mV
±12
±0.6
Gain error
GE
0.1
0.5
10
% FSR
mV/V
ppm/°C
ppm/°C
D.c. power supply rejection ratio
Zero code error temperature coefficient
Gain error temperature coefficient
DAC Output Specifications
Output voltage range
Output load regulation
DC PSRR
10
0
VDD - 0.1
0.3
V
2kΩ to 10kΩ load
0.1
%
See Note 7
Power Supplies
Active supply current
IDD
No load, VIH = VDD, VIL = 0V
VDD = 5.5V, VREF = 2.048V Slow
VDD = 5.5V, VREF = 2.048V Fast
See Note 8
0.6
1.6
1.0
2.5
mA
mA
Power down supply current
No load,
0.01
µA
all digital inputs 0V or VDD
Dynamic DAC Specifications
Slew rate
AC code 128 to 4095, 10%-90%
Slow
Fast
0.3
2.4
0.5
3.0
V/µs
V/µs
See Note 9
DAC code 128 to 4095
Slow
Settling time
12.0
4.0
µs
µs
Fast
See Note 10
Code 2047 to 2048
Glitch energy
10
nV-s
Reference
Reference input resistance
Reference input capacitance
Reference feedthrough
RREFIN
CREFIN
10
5
MΩ
pF
V
REF = 1VPP at 1kHz
-60
dB
+ 1.024V dc, DAC code 0
Reference input bandwidth
V
REF = 0.2VPP + 1.024V dc
DAC code 2048
Slow
0.5
1.0
MHz
MHz
Fast
Digital Inputs
High level input current
Low level input current
Input capacitance
IIH
IIL
CI
Input voltage = VDD
Input voltage = 0V
1
µA
µA
pF
-1
8
WOLFSON MICROELECTRONICS LTD
PD Rev 1.1 October 2000
3
WOLFSON [ WOLFSON MICROELECTRONICS PLC ]
