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W90N745CDG 参数 Datasheet PDF下载

W90N745CDG图片预览
型号: W90N745CDG
PDF下载: 下载PDF文件 查看货源
内容描述: 16位/ 32位ARM微控制器 [16/32-bit ARM microcontroller]
分类和应用: 微控制器和处理器外围集成电路时钟
文件页数/大小: 422 页 / 2455 K
品牌: WINBOND [ WINBOND ]
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W90N745CD/W90N745CDG  
Cache Test Register 1 (CTEST1)  
Cache Test Register that will be read back to provide the status of cache RAM BIST. Whether the BIST  
is finish and all of bank of SRAM are tested successfully will be presented in this register.  
REGISTER  
ADDRESS  
R/W  
DESCRIPTION  
Cache test register 1  
RESET VALUE  
CTEST1  
R
0xFFF6_0004  
0x0000_0000  
31  
FINISH  
23  
30  
22  
14  
6
29  
21  
13  
5
28  
27  
RESERVED  
19  
26  
18  
10  
25  
17  
9
24  
16  
8
20  
RESERVED  
15  
12  
11  
3
RESERVED  
4
7
2
1
0
BFAIL7  
BFAIL6  
BFAIL5  
BFAIL4  
BFAIL3  
BFAIL2  
BFAIL1  
BFAIL0  
BITS  
DESCRIPTION  
BIST completed  
This bit is “0” initially. When BIST mode enabled, this bit will be “1”  
after BIST test completed. The values of BFAIL0-7 are valid only  
after FINISH = 1.  
[31]  
FINISH  
[30:8]  
[7]  
RESERVED  
BFAIL7  
-
BIST test fail for data cache tag ram way 1  
If this bit equals to “1”, it indicates the data cache tag ram for way  
1 is tested fail by BIST. “0” means the test is passed.  
BIST test fail for data cache tag ram way 0  
[6]  
[5]  
[4]  
[3]  
BFAIL6  
BFAIL5  
BFAIL4  
BFAIL3  
If this bit equals to “1”, it indicates the data cache tag ram for way  
0 is tested fail by BIST. “0” means the test is passed.  
BIST test fail for instruction cache tag ram way 1  
If this bit equals to “1”, it indicates the instruction cache tag ram for  
way 1 is tested fail by BIST. “0” means the test is passed.  
BIST test fail for instruction cache tag ram way 0  
If this bit equals to “1”, it indicates the instruction cache tag ram for  
way 0 is tested fail by BIST. “0” means the test is passed.  
BIST test fail for data cache ram way 1  
If this bit equals to “1”, it indicates the data cache ram for way 1 is  
tested fail by BIST. “0” means the test is passed.  
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