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W90N745CDG 参数 Datasheet PDF下载

W90N745CDG图片预览
型号: W90N745CDG
PDF下载: 下载PDF文件 查看货源
内容描述: 16位/ 32位ARM微控制器 [16/32-bit ARM microcontroller]
分类和应用: 微控制器和处理器外围集成电路时钟
文件页数/大小: 422 页 / 2455 K
品牌: WINBOND [ WINBOND ]
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W90N745CD/W90N745CDG  
Continued.  
BITS  
DESCRIPTION  
BIST test fail for data cache ram way 0  
[2]  
[1]  
[0]  
BFAIL2  
BFAIL1  
BFAIL0  
If this bit equals to “1”, it indicates the data cache ram for way 0 is  
tested fail by BIST. “0” means the test is passed.  
BIST test fail for instruction cache ram way 1  
If this bit equals to “1”, it indicates the instruction cache ram for  
way 1 is tested fail by BIST. “0” means the test is passed.  
BIST test fail for instruction cache ram way 0  
If this bit equals to “1”, it indicates the instruction cache ram for  
way 0 is tested fail by BIST. “0” means the test is passed.  
Publication Release Date: September 22, 2006  
- 91 -  
Revision A2  
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