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29F400B-12TI 参数 Datasheet PDF下载

29F400B-12TI图片预览
型号: 29F400B-12TI
PDF下载: 下载PDF文件 查看货源
内容描述: [Flash, 512KX8, 120ns, PDSO48, TSOP-48]
分类和应用: 光电二极管内存集成电路
文件页数/大小: 38 页 / 227 K
品牌: WINBOND [ WINBOND ]
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BRIGHT  
Microelectronics  
Inc.  
Preliminary BM29F400T/BM29F400B  
DQ6  
Toggle Bit  
The BM29F400 also features the "Toggle Bit" as a method to indicate to the host system the status of  
the Internal Programming and Erase Algorithms (see Figure 4 for Toggle Bit (DQ6) flowchart.  
During an Internal Programming or Erase Algorithm cycle, successive attempts to read (OE toggling)  
data from the device will result in DQ6 toggling between one and zero. Once Internal Programming or  
Erase operation is completed, DQ6 will stop toggling and valid data will be read on the next  
successive attempts. During BYTE Programming, Toggle Bit is valid after the rising edge of the  
fourth WE pulse in the four write pulse sequence. For Chip Erase, Toggle Bit is valid after the rising  
edge of the sixth WE pulse in the six write pulse sequence. For Sector Erase, Toggle Bit is valid after  
the last rising edge of the sector erase WE pulse. Toggle Bit is also active during sector erase time-  
out window.  
In Byte/Word Programming, if the sector being written to is protected, the Toggle Bit will toggle for  
about 300 nS and then stop toggling without the data having changed. In Chip Erase or Sector Erase,  
the device will erase all the selected sectors except for the ones that are protected. If all selected  
sectors are protected, the chip will toggle the Toggle Bit for about 300ns and then drop back into read  
mode, having changed none of the data. Either CE or OE toggling will cause the DQ6 Toggle Bit I to  
toggle.  
DQ5  
Exceeded Timing Limits  
DQ5 will indicate if the Byte/Word Programming, Chip Erase, or Sector Erase time has exceeded the  
specified limits (internal pulse count) of the device. Under these conditions DQ5 will produce a logical  
"1". This is a failure condition which indicates that the program or erase cycle was not successfully  
completed. Data Polling is the only operating function of the device under this condition. The OE  
and WE pins will control the output disable functions as described in Table 1.  
If this failure condition occurs during Sector Erase operation, it specifies that particular sector is bad  
and it may not be reused. However, other sectors are still functional and may continue to be used for  
the program or erase operation. The device must be RESET to the Read mode to use other sectors  
of the device. Write the Read/Reset command sequence to the device, and then execute the  
Byte/Word Programming or Sector Erase command sequence. This allows the system to continue to  
use the other active sectors in the device.  
If this failure condition occurs during Chip Erase operation, it specifies that the entire chip is bad or  
combination of sectors are bad. In so, the chip should not be reused.  
If this failure condition occurs during Byte/Word Programming operation, it indicates the entire sector  
containing that BYTE is bad and this sector may not be reused (other sectors are still functional and  
can be reused.)  
The DQ5 failure condition may also appear if a user tries to program a non blank location without  
erasing. In this case, the device may exceed time limits and not complete the Internal Algorithm  
operation. Hence, the system never reads a valid data on DQ7 bit and DQ6 never stops toggling.  
Once the device has exceeded timing limits, the DQ5 bit will indicate a "1".  
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