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WED3EG72M18S265JD3SG 参数 Datasheet PDF下载

WED3EG72M18S265JD3SG图片预览
型号: WED3EG72M18S265JD3SG
PDF下载: 下载PDF文件 查看货源
内容描述: 128MB - 16Mx72 DDR SDRAM UNBUFFERED [128MB - 16Mx72 DDR SDRAM UNBUFFERED]
分类和应用: 存储内存集成电路动态存储器双倍数据速率
文件页数/大小: 12 页 / 197 K
品牌: WEDC [ WHITE ELECTRONIC DESIGNS CORPORATION ]
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WED3EG7218S-JD3  
White Electronic Designs  
PRELIMINARY  
Notes  
11. It is recommended that DQS be valid (HIGH or LOW) on or before  
the WRITE command. The case shown (DQS going from High-Z to  
logic LOW) applies when no WRITEs were previously in progress  
on the bus. If a previous WRITE was in progress, DQS could be  
1.  
All voltages referenced to VSS  
2.  
Tests for AC timing, IDD, and electrical AC and DC characteristics  
may be conducted at normal reference / supply voltage levels, but  
the related specications and device operations are guaranteed for  
the full voltage range specied.  
high during this time, depending on tDQSS  
.
12. The refresh period is 64ms. This equates to an average refresh  
rate of 7.8125µs. However, an AUTO REFRESH command must  
be asserted at least once every 70.3µs; burst refreshing or posting  
by the DRAM controller greater than eight refresh cycles is not  
allowed.  
3.  
Outputs are measured with equivalent load:  
V
TTT  
50Ω  
RReeffeerreennccee  
Outtppuut  
13. The valid data window is derived by achieving other specications  
- tHP (tCK/2), tDQSQ, and tQH (tQH = tHP - tQHS). The data valid  
window derates directly proportional with the clock duty cycle  
and a practical data valid window can be derived. The clock is  
allowed a maximum duty cycled variation of 45/55. Functionality  
is uncertain when operating beyond a 45/55 ratio. The data valid  
window derating curves are provided below for duty cycles ranging  
between 50/50 and 45/55.  
Poiint  
30pF  
(VOUT  
)
4.  
AC timing and IDD tests may use a VIL-to-VIH swing of up to 1.5V  
in the test environment, but input timing is still referenced to VREF  
(or to the crossing point for CK/CK#), and parameter specications  
are guaranteed for the specied AC input levels under normal use  
conditions. The minimum slew rate for the input signals used to  
test the device is 1V/ns in the range between VIL(AC) and VIH(AC).  
14. Referenced to each output group: x8 = DQS with DQ0-DQ7.  
15. READs and WRITEs with auto precharge are not allowed to be  
issued until tRAS (MIN) can be satised prior to the internal precharge  
command being issued.  
5.  
6.  
The AC and DC input level specications are dened in the SSTL_  
2 standard (i.e., the receiver will effectively switch as a result of the  
signal crossing the AC input level, and will remain in that state as  
long as the signal does not ring back above [below] the DC input  
LOW [high] level).  
16. JEDEC species CK and CK# input slew rate must be > 1V/ns  
(2V/ns differentially).  
17. DQ and DM input slew rates must not deviate from DQS by more  
than 10%. If the DQ/DM/DQS slew rate is less than 0.5V/ns,  
timing must be derated: 50ps must be added to tDS and tDH for  
each 100mV/ns reduction in slew rate. If slew rates exceed 4V/ns,  
functionality is uncertain.  
For slew rates less than 1V/ns and greater than or equal to 0.5V/  
ns. If the slew rate is less than 0.5V/ns, timing must be derated: tIS  
has an additional 50ps per each 100mV/ns reduction in slew rate  
from the 500mV/ns. tIH has 0ps added, that is, it remains constant.  
If the slew rate exceeds 4.5V/ns, functionality is uncertain. For 403  
and 335, slew rates must be greater than or equal to 0.5V/ns.  
18.  
tHP min is the lesser of tCL min and tCH min actually applied to the  
device CK and CK# inputs, collectively during bank active.  
19.  
t
HZ (MAX) will prevail over the tDQSCK (MAX) + tRPST (MAX)  
7.  
8.  
Inputs are not recognized as valid until VREF stabilizes. Exception:  
during the period before VREF stabilizes, CKE 0.3 x VCCQ is  
recognized as LOW.  
condition. tLZ (MIN) will prevail over tDQSCK (MIN) + PRE (MAX)  
condition.  
20. For slew rates greater than 1V/ns the (LZ) transition will start about  
310ps earlier.  
tHZ and tLZ transitions occur in the same access time windows as  
valid data transitions. These parameters are not referenced to a  
specic voltage level, but specify when the device output is no  
longer driving (HZ) and begins driving (LZ).  
21. CKE must be active (High) during the entire time a refresh  
command is executed. That is, from the time the AUTO REFRESH  
command is registered, CKE must be active at each rising clock  
edge, until tRFC has been satised.  
9.  
The intent of the “Don’t Care” state after completion of the  
postamble is the DQS-driven signal should either be HIGH, LOW,  
or high-Z, and that any signal transition within the input switching  
region must follow valid input requirements. That is, if DQS  
transitions HIGH (above VIHDC (MIN) then it must not transition  
LOW (below VIHDC) prior to tDQSH (MIN).  
22. Whenever the operating frequency is altered, not including jitter,  
the DLL is required to be reset. This is followed by 200 clock cycles  
(before READ commands).  
10. This is not a device limit. The device will operate with a negative  
value, but system performance could be degraded due to bus  
turnaround.  
June 2006  
Rev. 2  
9
White Electronic Designs Corporation • (602) 437-1520 • www.wedc.com  
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